TY  - BOOK
AU  - Marchette,David J.
TI  - Random graphs for statistical pattern recognition
T2  - Wiley series in probability and statistics
SN  - 0471221767
AV  - QA166.17 .M37 2004
U1  - 511/.5 22
PY  - 2004///
CY  - Hoboken, N.J.
PB  - Wiley-Interscience
KW  - Grafos aleatorios
KW  - lemb
KW  - Reconocimiento de modelos
KW  - Random graphs
KW  - Pattern perception
KW  - Statistical methods
KW  - Pattern recognition systems
KW  - Graphes aléatoires
KW  - Perception des structures
KW  - Méthodes statistiques
KW  - Reconnaissance des formes (Informatique)
N1  - Incluye referencias bibliográficas (p. 213-227) e índice
UR  - http://www.loc.gov/catdir/bios/wiley044/2003063762.html
UR  - http://www.loc.gov/catdir/description/wiley041/2003063762.html
UR  - http://www.loc.gov/catdir/toc/wiley041/2003063762.html
ER  -