Lock-in Thermography
Breitenstein, Otwin.
Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials / [recurso electrónico] : by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp. - X, 258 p. online resource. - Springer Series in Advanced Microelectronics, 10 1437-0387 ; . - Springer Series in Advanced Microelectronics, 10 .
Introduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook.
This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.
9783642024177
Physics.
Engineering.
Materials.
Surfaces (Physics).
Physics.
Optics, Optoelectronics, Plasmonics and Optical Devices.
Characterization and Evaluation of Materials.
Engineering, general.
Structural Materials.
QC350-467 TA1501-1820 QC392-449.5 TA1750-1750.22
621.36
Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials / [recurso electrónico] : by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp. - X, 258 p. online resource. - Springer Series in Advanced Microelectronics, 10 1437-0387 ; . - Springer Series in Advanced Microelectronics, 10 .
Introduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook.
This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.
9783642024177
Physics.
Engineering.
Materials.
Surfaces (Physics).
Physics.
Optics, Optoelectronics, Plasmonics and Optical Devices.
Characterization and Evaluation of Materials.
Engineering, general.
Structural Materials.
QC350-467 TA1501-1820 QC392-449.5 TA1750-1750.22
621.36
