Vista normal Vista MARC Vista ISBD

Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.] - 4th ed. - New York, NY : Springer, 2018. - xxiii, 550 p. : 29 cm. il. ;

Incluye referencias bibliográficas e índice.

ISBN: 9781493966769 9781493966745

Subjects--Topical Terms:
Microscopia.

LC Class. No.: QH212.S3 / S23 2018