Strain Effect in Semiconductors (Registro nro. 199015)

MARC details
000 -LÍDER
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001 - NÚMERO DE CONTROL
control field u371135
003 - IDENTIFICADOR DEL NÚMERO DE CONTROL
control field SIRSI
005 - FECHA Y HORA DE LA ULTIMA TRANSACCIÓN
control field 20160812080111.0
007 - CAMPO FIJO DE DESCRIPCIÓN FIJA--INFORMACIÓN GENERAL
fixed length control field cr nn 008mamaa
008 - ELEMENTOS DE LONGITUD FIJA -- INFORMACIÓN GENERAL
fixed length control field 100301s2010 xxu| s |||| 0|eng d
020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS
International Standard Book Number 9781441905529
-- 978-1-4419-0552-9
040 ## - FUENTE DE CATALOGACIÓN
Transcribing agency MX-MeUAM
050 #4 - SIGNATURA TOPOGRÁFICA DE LA BIBLIOTECA DEL CONGRESO
Classification number TK7800-8360
050 #4 - SIGNATURA TOPOGRÁFICA DE LA BIBLIOTECA DEL CONGRESO
Classification number TK7874-7874.9
082 04 - NÚMERO DE CLASIFICACIÓN DECIMAL DEWEY
Classification number 621.381
Edition number 23
100 1# - ASIENTO PRINCIPAL--NOMBRE PERSONAL
Personal name Sun, Yongke.
Relator term author.
245 10 - MENCIÓN DE TITULO
Title Strain Effect in Semiconductors
Medium [recurso electrónico] :
Remainder of title Theory and Device Applications /
Statement of responsibility, etc. by Yongke Sun, Scott E. Thompson, Toshikazu Nishida.
250 ## - MENCIÓN DE EDICIÓN
Edition statement First.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Boston, MA :
Name of producer, publisher, distributor, manufacturer Springer US,
Date of production, publication, distribution, manufacture, or copyright notice 2010.
300 ## - DESCRIPCIÓN FÍSICA
Extent XII, 350 p.
Other physical details online resource.
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
347 ## - DIGITAL FILE CHARACTERISTICS
File type text file
Encoding format PDF
Source rda
505 0# - NOTA DE CONTENIDO
Formatted contents note Overview: The Age of Strained Devices -- Band Structures of Strained Semiconductors -- Stress, Strain, Piezoresistivity, and Piezoelectricity -- Strain and Semiconductor Crystal Symmetry -- Band Structures of Strained Semiconductors -- Low-Dimensional Semiconductor Structures -- Transport Theory of Strained Semiconductors -- Semiconductor Transport -- Strain in Semiconductor Devices -- Strain in Electron Devices -- Piezoresistive Strain Sensors -- Strain Effects on Optoelectronic Devices.
520 ## - NOTA DE RESUMEN, ETC.
Summary, etc. Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant applications of strain while also focusing on the fundamental physics as they pertain to bulk, planar, and scaled nano-devices. Lead authors Yongke Sun, Scott Thompson and Toshikazu Nishida also: Treat strain physics at both the qualitative overview level as well as provide detailed fundamentals Explain strain physics relevant to logic devices as well as strain-based MEMS This book is relevant to current strained Si logic technology, as well as for understanding the physics and scaling of future strain nano-scale devices. It is perfect for practicing device engineers at semiconductor manufacturers, as well as graduate students studying device physics at universities.
596 ## -
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650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Engineering.
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Electronics.
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Optical materials.
650 14 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Engineering.
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Electronics and Microelectronics, Instrumentation.
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Solid State Physics.
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Spectroscopy and Microscopy.
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Optical and Electronic Materials.
700 1# - ASIENTO SECUNDARIO - NOMBRE PERSONAL
Personal name Thompson, Scott E.
Relator term author.
700 1# - ASIENTO SECUNDARIO - NOMBRE PERSONAL
Personal name Nishida, Toshikazu.
Relator term author.
710 2# - ASIENTO SECUNDARIO - NOMBRE CORPORATIVO
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Printed edition:
International Standard Book Number 9781441905512
856 40 - LOCALIZACIÓN Y ACCESO ELECTRÓNICOS
Public note Libro electrónico
Uniform Resource Identifier <a href="http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-1-4419-0552-9">http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-1-4419-0552-9</a>
942 ## - TIPO DE MATERIAL (KOHA)
Koha item type Libro Electrónico
Existencias
Estado de retiro Fuente de clasificación Colección Ubicación permanente Ubicación actual Fecha de ingreso Total Checkouts Signatura topográfica Código de barras Date last seen Número de copia Tipo de material
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