Power-Aware Testing and Test Strategies for Low Power Devices (Registro nro. 199086)

MARC details
000 -LÍDER
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001 - NÚMERO DE CONTROL
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003 - IDENTIFICADOR DEL NÚMERO DE CONTROL
control field SIRSI
005 - FECHA Y HORA DE LA ULTIMA TRANSACCIÓN
control field 20160812080115.0
007 - CAMPO FIJO DE DESCRIPCIÓN FIJA--INFORMACIÓN GENERAL
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008 - ELEMENTOS DE LONGITUD FIJA -- INFORMACIÓN GENERAL
fixed length control field 110414s2010 xxu| s |||| 0|eng d
020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS
International Standard Book Number 9781441909282
-- 978-1-4419-0928-2
040 ## - FUENTE DE CATALOGACIÓN
Transcribing agency MX-MeUAM
050 #4 - SIGNATURA TOPOGRÁFICA DE LA BIBLIOTECA DEL CONGRESO
Classification number TK7888.4
082 04 - NÚMERO DE CLASIFICACIÓN DECIMAL DEWEY
Classification number 621.3815
Edition number 23
100 1# - ASIENTO PRINCIPAL--NOMBRE PERSONAL
Personal name Girard, Patrick.
Relator term editor.
245 10 - MENCIÓN DE TITULO
Title Power-Aware Testing and Test Strategies for Low Power Devices
Medium [recurso electrónico] /
Statement of responsibility, etc. edited by Patrick Girard, Nicola Nicolici, Xiaoqing Wen.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Boston, MA :
Name of producer, publisher, distributor, manufacturer Springer US,
Date of production, publication, distribution, manufacture, or copyright notice 2010.
300 ## - DESCRIPCIÓN FÍSICA
Extent XXI, 363 p.
Other physical details online resource.
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
347 ## - DIGITAL FILE CHARACTERISTICS
File type text file
Encoding format PDF
Source rda
505 0# - NOTA DE CONTENIDO
Formatted contents note Fundamentals of VLSI Testing -- Power Issues During Test -- Low-Power Test Pattern Generation -- Power-Aware Design-for-Test -- Power-Aware Test Data Compression and BIST -- Power-Aware System-Level Test Planning -- Low-Power Design Techniques and Test Implications -- Test Strategies for Multivoltage Designs -- Test Strategies for Gated Clock Designs -- Test of Power Management Structures -- EDA Solution for Power-Aware Design-for-Test.
520 ## - NOTA DE RESUMEN, ETC.
Summary, etc. Power-Aware Testing and Test Strategies for Low-Power Devices Edited by: Patrick Girard, Research Director, CNRS / LIRMM, France Nicola Nicolici, Associate Professor, McMaster University, Canada Xiaoqing Wen, Professor, Kyushu Institute of Technology, Japan Managing the power consumption of circuits and systems is now considered as one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low-power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and Electronic Design Automation (EDA) solutions for testing low-power devices. The first comprehensive book on power-aware test for (low-power) circuits and systems Shows readers how low-power devices can be tested safely without affecting yield and reliability Includes necessary background information on design-for-test and low-power design Covers in detail power-constrained test techniques, including power-aware automatic test pattern generation, design-for-test, built-in self-test and test compression Presents state-of-the-art industrial practices and EDA solutions
596 ## -
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650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Engineering.
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Computer aided design.
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Systems engineering.
650 14 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Engineering.
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Circuits and Systems.
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Computer-Aided Engineering (CAD, CAE) and Design.
700 1# - ASIENTO SECUNDARIO - NOMBRE PERSONAL
Personal name Nicolici, Nicola.
Relator term editor.
700 1# - ASIENTO SECUNDARIO - NOMBRE PERSONAL
Personal name Wen, Xiaoqing.
Relator term editor.
710 2# - ASIENTO SECUNDARIO - NOMBRE CORPORATIVO
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Printed edition:
International Standard Book Number 9781441909275
856 40 - LOCALIZACIÓN Y ACCESO ELECTRÓNICOS
Public note Libro electrónico
Uniform Resource Identifier <a href="http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-1-4419-0928-2">http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-1-4419-0928-2</a>
942 ## - TIPO DE MATERIAL (KOHA)
Koha item type Libro Electrónico
Existencias
Estado de retiro Fuente de clasificación Colección Ubicación permanente Ubicación actual Fecha de ingreso Total Checkouts Signatura topográfica Código de barras Date last seen Número de copia Tipo de material
    Colección de Libros Electrónicos Biblioteca Electrónica Biblioteca Electrónica     TK7888.4 371206-2001 12/08/2016 1 Libro Electrónico

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