Analysis and Design of Resilient VLSI Circuits (Registro nro. 199087)

MARC details
000 -LÍDER
fixed length control field 03524nam a22004335i 4500
001 - NÚMERO DE CONTROL
control field u371207
003 - IDENTIFICADOR DEL NÚMERO DE CONTROL
control field SIRSI
005 - FECHA Y HORA DE LA ULTIMA TRANSACCIÓN
control field 20160812080115.0
007 - CAMPO FIJO DE DESCRIPCIÓN FIJA--INFORMACIÓN GENERAL
fixed length control field cr nn 008mamaa
008 - ELEMENTOS DE LONGITUD FIJA -- INFORMACIÓN GENERAL
fixed length control field 100301s2010 xxu| s |||| 0|eng d
020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS
International Standard Book Number 9781441909312
-- 978-1-4419-0931-2
040 ## - FUENTE DE CATALOGACIÓN
Transcribing agency MX-MeUAM
050 #4 - SIGNATURA TOPOGRÁFICA DE LA BIBLIOTECA DEL CONGRESO
Classification number TK7888.4
082 04 - NÚMERO DE CLASIFICACIÓN DECIMAL DEWEY
Classification number 621.3815
Edition number 23
100 1# - ASIENTO PRINCIPAL--NOMBRE PERSONAL
Personal name Garg, Rajesh.
Relator term author.
245 10 - MENCIÓN DE TITULO
Title Analysis and Design of Resilient VLSI Circuits
Medium [recurso electrónico] :
Remainder of title Mitigating Soft Errors and Process Variations /
Statement of responsibility, etc. by Rajesh Garg, Sunil P. Khatri.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Boston, MA :
Name of producer, publisher, distributor, manufacturer Springer US,
Date of production, publication, distribution, manufacture, or copyright notice 2010.
300 ## - DESCRIPCIÓN FÍSICA
Other physical details online resource.
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
347 ## - DIGITAL FILE CHARACTERISTICS
File type text file
Encoding format PDF
Source rda
505 0# - NOTA DE CONTENIDO
Formatted contents note Soft Errors -- Analytical Determination of Radiation-induced Pulse Width in Combinational Circuits -- Analytical Determination of the Radiation-induced Pulse Shape -- Modeling Dynamic Stability of SRAMs in the Presence of Radiation Particle Strikes -- 3D Simulation and Analysis of the Radiation Tolerance of Voltage Scaled Digital Circuits -- Clamping Diode-based Radiation Tolerant Circuit Design Approach -- Split-output-based Radiation Tolerant Circuit Design Approach -- Process Variations -- Sensitizable Statistical Timing Analysis -- A Variation Tolerant Combinational Circuit Design Approach Using Parallel Gates -- Process Variation Tolerant Single-supply True Voltage Level Shifter -- Conclusions and Future Directions.
520 ## - NOTA DE RESUMEN, ETC.
Summary, etc. This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors. This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems. Describes the state of the art in the areas of radiation tolerant circuit design and process variation tolerant circuit design; Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems; Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers.
596 ## -
-- 19
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Engineering.
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Computer aided design.
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Systems engineering.
650 14 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Engineering.
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Circuits and Systems.
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Computer-Aided Engineering (CAD, CAE) and Design.
700 1# - ASIENTO SECUNDARIO - NOMBRE PERSONAL
Personal name Khatri, Sunil P.
Relator term author.
710 2# - ASIENTO SECUNDARIO - NOMBRE CORPORATIVO
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Printed edition:
International Standard Book Number 9781441909305
856 40 - LOCALIZACIÓN Y ACCESO ELECTRÓNICOS
Public note Libro electrónico
Uniform Resource Identifier <a href="http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-1-4419-0931-2">http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-1-4419-0931-2</a>
942 ## - TIPO DE MATERIAL (KOHA)
Koha item type Libro Electrónico
Existencias
Estado de retiro Fuente de clasificación Colección Ubicación permanente Ubicación actual Fecha de ingreso Total Checkouts Signatura topográfica Código de barras Date last seen Número de copia Tipo de material
    Colección de Libros Electrónicos Biblioteca Electrónica Biblioteca Electrónica     TK7888.4 371207-2001 12/08/2016 1 Libro Electrónico

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