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101212s2011 xxu| s |||| 0|eng d |
| 020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS |
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| International Standard Book Number |
9781441971678 |
| -- |
978-1-4419-7167-8 |
| 040 ## - FUENTE DE CATALOGACIÓN |
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| Transcribing agency |
MX-MeUAM |
| 050 #4 - SIGNATURA TOPOGRÁFICA DE LA BIBLIOTECA DEL CONGRESO |
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| Classification number |
TA404.6 |
| 082 04 - NÚMERO DE CLASIFICACIÓN DECIMAL DEWEY |
|---|
| Classification number |
620.11 |
| Edition number |
23 |
| 100 1# - ASIENTO PRINCIPAL--NOMBRE PERSONAL |
|---|
| Personal name |
Kalinin, Sergei V. |
| Relator term |
editor. |
| 245 10 - MENCIÓN DE TITULO |
|---|
| Title |
Scanning Probe Microscopy of Functional Materials |
| Medium |
[recurso electrónico] : |
| Remainder of title |
Nanoscale Imaging and Spectroscopy / |
| Statement of responsibility, etc. |
edited by Sergei V. Kalinin, Alexei Gruverman. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
|---|
| Place of production, publication, distribution, manufacture |
New York, NY : |
| Name of producer, publisher, distributor, manufacturer |
Springer New York, |
| Date of production, publication, distribution, manufacture, or copyright notice |
2011. |
| 300 ## - DESCRIPCIÓN FÍSICA |
|---|
| Extent |
XVIII, 555 p. |
| Other physical details |
online resource. |
| 336 ## - CONTENT TYPE |
|---|
| Content type term |
text |
| Content type code |
txt |
| Source |
rdacontent |
| 337 ## - MEDIA TYPE |
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| Media type term |
computer |
| Media type code |
c |
| Source |
rdamedia |
| 338 ## - CARRIER TYPE |
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| Carrier type term |
online resource |
| Carrier type code |
cr |
| Source |
rdacarrier |
| 347 ## - DIGITAL FILE CHARACTERISTICS |
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| File type |
text file |
| Encoding format |
PDF |
| Source |
rda |
| 505 0# - NOTA DE CONTENIDO |
|---|
| Formatted contents note |
I. Emergent phenomena in strongly-correlated systems: Phase separation and novel quaziparticles in nanowires -- STM of ruthenates and manganites -- STM of superconductors -- STM of cuprates -- II. Semiconductor and photovoltaic materials: SPM of solar materials -- Cross-sectional STM of semiconductor heterostructures -- Charge dynamics in photovoltaic polymers -- III. Functional probing of biosystems and macromolecules: Molecular Imaging of biomembranes single molecules with electrically functionalized probes -- AFM/patch clamp in biology -- Electrical imaging of membranes -- Cell dynamics by Ion conductance microscopy -- Ferroelectric polymers -- IV. SPM of magnetic materials: Spin manipulation by STM -- Magnetic Resonant Force Microscopy -- Magnetic Force Microscopy -- V. Electromechanics on the nanoscale: ferroelectrics and multiferroics: New dynamic modes and energy dissipation in SPM -- Polarization dynamics in relaxor ferroelectrics -- Piezoresponse Force Spectroscopy -- Polarization dynamics in capacitors and heterostructures -- VI. Mechanical properties: Nanomechanics by SPM -- Atomic Force Acoustic Microscopy of functional materials -- VII. Optical methods: NSOM and NSOM-transport -- NSOM -- Optical machines and unfolding -- Optically-assisted pump-probe STM -- VIII. Emerging SPM applications: STM/NC-AFM -- Scanning Non-linear Dielectric Microscopy -- Vibrational spectroscopy of single molecule -- Ultrafast ac STM -- SPM and electron microscopy combined -- In-situ STEM-nanoindentation -- Material characterization by SPM-focused X-ray combination -- *see Long ToC for tentative contributors. |
| 520 ## - NOTA DE RESUMEN, ETC. |
|---|
| Summary, etc. |
Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging applications of spectroscopic imaging and multifrequency SPM methods, thermomechanical characterization, ion-conductance microscopy, as well as combined SPM-mass spectrometry, SPM-patch clamp, and SPM-focused X-ray applications. By bringing together critical reviews by leading researchers on the application of SPM to the nanoscale characterization of functional materials properties, Scanning Probe Microscopy of Functional Materials provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology. Key Features: •Serves the rapidly developing field of nanoscale characterization of functional materials properties •Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors •Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations •Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization |
| 596 ## - |
|---|
| -- |
19 |
| 650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Surfaces (Physics). |
| 650 14 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Materials Science. |
| 650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Characterization and Evaluation of Materials. |
| 700 1# - ASIENTO SECUNDARIO - NOMBRE PERSONAL |
|---|
| Personal name |
Gruverman, Alexei. |
| Relator term |
editor. |
| 710 2# - ASIENTO SECUNDARIO - NOMBRE CORPORATIVO |
|---|
| Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
| 773 0# - HOST ITEM ENTRY |
|---|
| Title |
Springer eBooks |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Relationship information |
Printed edition: |
| International Standard Book Number |
9781441965677 |
| 856 40 - LOCALIZACIÓN Y ACCESO ELECTRÓNICOS |
|---|
| Public note |
Libro electrónico |
| Uniform Resource Identifier |
<a href="http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-1-4419-7167-8">http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-1-4419-7167-8</a> |
| 942 ## - TIPO DE MATERIAL (KOHA) |
|---|
| Koha item type |
Libro Electrónico |
