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001 - NÚMERO DE CONTROL |
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003 - IDENTIFICADOR DEL NÚMERO DE CONTROL |
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005 - FECHA Y HORA DE LA ULTIMA TRANSACCIÓN |
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20160812080151.0 |
007 - CAMPO FIJO DE DESCRIPCIÓN FIJA--INFORMACIÓN GENERAL |
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008 - ELEMENTOS DE LONGITUD FIJA -- INFORMACIÓN GENERAL |
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110324s2011 xxu| s |||| 0|eng d |
020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS |
International Standard Book Number |
9781441972002 |
-- |
978-1-4419-7200-2 |
040 ## - FUENTE DE CATALOGACIÓN |
Transcribing agency |
MX-MeUAM |
050 #4 - SIGNATURA TOPOGRÁFICA DE LA BIBLIOTECA DEL CONGRESO |
Classification number |
TA1750-1750.22 |
082 04 - NÚMERO DE CLASIFICACIÓN DECIMAL DEWEY |
Classification number |
620.11295 |
Edition number |
23 |
082 04 - NÚMERO DE CLASIFICACIÓN DECIMAL DEWEY |
Classification number |
620.11297 |
Edition number |
23 |
100 1# - ASIENTO PRINCIPAL--NOMBRE PERSONAL |
Personal name |
Pennycook, Stephen J. |
Relator term |
editor. |
245 10 - MENCIÓN DE TITULO |
Title |
Scanning Transmission Electron Microscopy |
Medium |
[recurso electrónico] : |
Remainder of title |
Imaging and Analysis / |
Statement of responsibility, etc. |
edited by Stephen J. Pennycook, Peter D. Nellist. |
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
Place of production, publication, distribution, manufacture |
New York, NY : |
Name of producer, publisher, distributor, manufacturer |
Springer New York : |
-- |
Imprint: Springer, |
Date of production, publication, distribution, manufacture, or copyright notice |
2011. |
300 ## - DESCRIPCIÓN FÍSICA |
Extent |
XII, 762 p. |
Other physical details |
online resource. |
336 ## - CONTENT TYPE |
Content type term |
text |
Content type code |
txt |
Source |
rdacontent |
337 ## - MEDIA TYPE |
Media type term |
computer |
Media type code |
c |
Source |
rdamedia |
338 ## - CARRIER TYPE |
Carrier type term |
online resource |
Carrier type code |
cr |
Source |
rdacarrier |
347 ## - DIGITAL FILE CHARACTERISTICS |
File type |
text file |
Encoding format |
PDF |
Source |
rda |
505 0# - NOTA DE CONTENIDO |
Formatted contents note |
Electron Optics and Aberration Correction -- Fundamentals of Scattering Theory -- Image formation in STEM -- Electron energy loss spectroscopy -- Energy dispersive x-ray analysis -- STEM of complex oxides -- STEM of complex alloys -- STEM of catalysts -- STEM of semiconductor devices -- STEM of ceramic materials -- STEM of quasicrystals -- STEM of nanomaterials -- 3D STEM: tomography -- 3D STEM: depth slicing -- Nanobeam diffraction. |
520 ## - NOTA DE RESUMEN, ETC. |
Summary, etc. |
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the editors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy: Imaging and Analysis provides a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the history of the field, the instrument, image formation and scattering theory, as well as practical aspects of imaging and analysis. The authors present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, and nanoscience. Therefore this is a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy. |
596 ## - |
-- |
19 |
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Microscopy. |
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Optical materials. |
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Nanotechnology. |
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Surfaces (Physics). |
650 14 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Materials Science. |
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Optical and Electronic Materials. |
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Characterization and Evaluation of Materials. |
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Biological Microscopy. |
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Solid State Physics. |
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Condensed Matter Physics. |
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Nanotechnology. |
700 1# - ASIENTO SECUNDARIO - NOMBRE PERSONAL |
Personal name |
Nellist, Peter D. |
Relator term |
editor. |
710 2# - ASIENTO SECUNDARIO - NOMBRE CORPORATIVO |
Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY |
Title |
Springer eBooks |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
Relationship information |
Printed edition: |
International Standard Book Number |
9781441971999 |
856 40 - LOCALIZACIÓN Y ACCESO ELECTRÓNICOS |
Public note |
Libro electrónico |
Uniform Resource Identifier |
<a href="http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-1-4419-7200-2">http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-1-4419-7200-2</a> |
942 ## - TIPO DE MATERIAL (KOHA) |
Koha item type |
Libro Electrónico |