MARC details
000 -LÍDER |
fixed length control field |
03355nam a22004455i 4500 |
001 - NÚMERO DE CONTROL |
control field |
u372337 |
003 - IDENTIFICADOR DEL NÚMERO DE CONTROL |
control field |
SIRSI |
005 - FECHA Y HORA DE LA ULTIMA TRANSACCIÓN |
control field |
20160812084053.0 |
007 - CAMPO FIJO DE DESCRIPCIÓN FIJA--INFORMACIÓN GENERAL |
fixed length control field |
cr nn 008mamaa |
008 - ELEMENTOS DE LONGITUD FIJA -- INFORMACIÓN GENERAL |
fixed length control field |
110714s2011 xxu| s |||| 0|eng d |
020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS |
International Standard Book Number |
9781441999467 |
-- |
978-1-4419-9946-7 |
040 ## - FUENTE DE CATALOGACIÓN |
Transcribing agency |
MX-MeUAM |
050 #4 - SIGNATURA TOPOGRÁFICA DE LA BIBLIOTECA DEL CONGRESO |
Classification number |
TJ210.2-211.495 |
050 #4 - SIGNATURA TOPOGRÁFICA DE LA BIBLIOTECA DEL CONGRESO |
Classification number |
TJ163.12 |
082 04 - NÚMERO DE CLASIFICACIÓN DECIMAL DEWEY |
Classification number |
629.8 |
Edition number |
23 |
100 1# - ASIENTO PRINCIPAL--NOMBRE PERSONAL |
Personal name |
Clévy, Cédric. |
Relator term |
editor. |
245 10 - MENCIÓN DE TITULO |
Title |
Signal Measurement and Estimation Techniques for Micro and Nanotechnology |
Medium |
[recurso electrónico] / |
Statement of responsibility, etc. |
edited by Cédric Clévy, Micky Rakotondrabe, Nicolas Chaillet. |
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
Place of production, publication, distribution, manufacture |
New York, NY : |
Name of producer, publisher, distributor, manufacturer |
Springer New York, |
Date of production, publication, distribution, manufacture, or copyright notice |
2011. |
300 ## - DESCRIPCIÓN FÍSICA |
Extent |
X, 242p. 155 illus. |
Other physical details |
online resource. |
336 ## - CONTENT TYPE |
Content type term |
text |
Content type code |
txt |
Source |
rdacontent |
337 ## - MEDIA TYPE |
Media type term |
computer |
Media type code |
c |
Source |
rdamedia |
338 ## - CARRIER TYPE |
Carrier type term |
online resource |
Carrier type code |
cr |
Source |
rdacarrier |
347 ## - DIGITAL FILE CHARACTERISTICS |
File type |
text file |
Encoding format |
PDF |
Source |
rda |
505 0# - NOTA DE CONTENIDO |
Formatted contents note |
Microscale Specificities -- Observer Techniques Applied to the Control of Piezoelectric Microactuators -- Measurement and Control for High-Speed Sub-Atomic Positioning in Scanning Probe Microscopes -- Microrobotic tools for the measurement of small forces -- Distinguishing Healthy and Defective Oocytes during Intracytoplasmic Sperm Injection -- In situ Characterizations of Thin-film Nanostructures with Large-range Direct Force Sensing -- A mechanism approach for enhancing the dynamic range and linearity of MEMS Optical Force Sensing -- Observer-based estimation of weak forces in a nanosystem measurement device. |
520 ## - NOTA DE RESUMEN, ETC. |
Summary, etc. |
Signal Measurement and Estimation Techniques for Micro and Nanotechnology discusses micro, nano and robotic cells and gives a state-of-the-art presentation of the different techniques and solutions to measure and estimate signals at the micro and nano scale. New technologies and applications such as micromanipulation (artificial components, biological objects), micro-assembly (MEMS, MOEMS, NEMS) and material and surface force characterization are covered. The importance of sensing at the micro and nano scale is presented as a key issue in control systems, as well as for understanding the physical phenomena of these systems. This book also: Explains issues that make signal measurement and estimation techniques difficult at the micro-nano-scale and offers solutions Discusses automated micro-assembly, and control of micro-nano robotic devices Presents and links signal measurement and estimation techniques for micro-nano scale systems with microfabrication methods, sensors integration and control schemes Signal Measurement and Estimation Techniques for Micro and Nanotechnology is a must-read for researchers and engineers working in MEMS and control systems. |
596 ## - |
-- |
19 |
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Engineering. |
650 14 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Engineering. |
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Control, Robotics, Mechatronics. |
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Nanotechnology and Microengineering. |
650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Signal, Image and Speech Processing. |
700 1# - ASIENTO SECUNDARIO - NOMBRE PERSONAL |
Personal name |
Rakotondrabe, Micky. |
Relator term |
editor. |
700 1# - ASIENTO SECUNDARIO - NOMBRE PERSONAL |
Personal name |
Chaillet, Nicolas. |
Relator term |
editor. |
710 2# - ASIENTO SECUNDARIO - NOMBRE CORPORATIVO |
Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY |
Title |
Springer eBooks |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
Relationship information |
Printed edition: |
International Standard Book Number |
9781441999450 |
856 40 - LOCALIZACIÓN Y ACCESO ELECTRÓNICOS |
Public note |
Libro electrónico |
Uniform Resource Identifier |
<a href="http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-1-4419-9946-7">http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-1-4419-9946-7</a> |
942 ## - TIPO DE MATERIAL (KOHA) |
Koha item type |
Libro Electrónico |