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SIRSI |
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20160812084151.0 |
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100715s2010 gw | s |||| 0|eng d |
| 020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS |
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| International Standard Book Number |
9783642035357 |
| -- |
978-3-642-03535-7 |
| 040 ## - FUENTE DE CATALOGACIÓN |
|---|
| Transcribing agency |
MX-MeUAM |
| 050 #4 - SIGNATURA TOPOGRÁFICA DE LA BIBLIOTECA DEL CONGRESO |
|---|
| Classification number |
T174.7 |
| 050 #4 - SIGNATURA TOPOGRÁFICA DE LA BIBLIOTECA DEL CONGRESO |
|---|
| Classification number |
TA418.9.N35 |
| 082 04 - NÚMERO DE CLASIFICACIÓN DECIMAL DEWEY |
|---|
| Classification number |
620.115 |
| Edition number |
23 |
| 100 1# - ASIENTO PRINCIPAL--NOMBRE PERSONAL |
|---|
| Personal name |
Bhushan, Bharat. |
| Relator term |
editor. |
| 245 10 - MENCIÓN DE TITULO |
|---|
| Title |
Scanning Probe Microscopy in Nanoscience and Nanotechnology |
| Medium |
[recurso electrónico] / |
| Statement of responsibility, etc. |
edited by Bharat Bhushan. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
|---|
| Place of production, publication, distribution, manufacture |
Berlin, Heidelberg : |
| Name of producer, publisher, distributor, manufacturer |
Springer Berlin Heidelberg, |
| Date of production, publication, distribution, manufacture, or copyright notice |
2010. |
| 300 ## - DESCRIPCIÓN FÍSICA |
|---|
| Extent |
XXX, 956p. 300 illus. |
| Other physical details |
online resource. |
| 336 ## - CONTENT TYPE |
|---|
| Content type term |
text |
| Content type code |
txt |
| Source |
rdacontent |
| 337 ## - MEDIA TYPE |
|---|
| Media type term |
computer |
| Media type code |
c |
| Source |
rdamedia |
| 338 ## - CARRIER TYPE |
|---|
| Carrier type term |
online resource |
| Carrier type code |
cr |
| Source |
rdacarrier |
| 347 ## - DIGITAL FILE CHARACTERISTICS |
|---|
| File type |
text file |
| Encoding format |
PDF |
| Source |
rda |
| 490 1# - MENCIÓN DE SERIE |
|---|
| Series statement |
NanoScience and Technology, |
| International Standard Serial Number |
1434-4904 |
| 505 0# - NOTA DE CONTENIDO |
|---|
| Formatted contents note |
Scanning Probe Microscopy Techniques -- Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids -- Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy -- Polarization-Sensitive Tip-Enhanced Raman Scattering -- Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes -- Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics -- Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity -- Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter -- Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope -- Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy -- Characterization -- Simultaneous Topography and Recognition Imaging -- Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM -- Force-Extension and Force-Clamp AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical Properties of Single Biomolecules -- Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices -- Quantized Mechanics of Nanotubes and Bundles -- Spin and Charge Pairing Instabilities in Nanoclusters and Nanomaterials -- Mechanical Properties of One-Dimensional Nanostructures -- Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale -- Controlling Wear on Nanoscale -- Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping -- Industrial Applications -- Modern Atomic Force Microscopy and Its Application to the Study of Genome Architecture -- Near-Field Optical Litography -- A New AFM-Based Lithography Method: Thermochemical Nanolithography -- Scanning Probe Alloying Nanolithography -- Structuring the Surface of Crystallizable Polymers with an AFM Tip -- Application of Contact Mode AFM to Manufacturing Processes -- Scanning Probe Microscopy as a Tool Applied to Agriculture. |
| 520 ## - NOTA DE RESUMEN, ETC. |
|---|
| Summary, etc. |
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber |
| 596 ## - |
|---|
| -- |
19 |
| 650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Materials. |
| 650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Engineering. |
| 650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Nanotechnology. |
| 650 14 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Material Science. |
| 650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Nanotechnology. |
| 650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Condensed Matter Physics. |
| 650 24 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Engineering, general. |
| 710 2# - ASIENTO SECUNDARIO - NOMBRE CORPORATIVO |
|---|
| Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
| 773 0# - HOST ITEM ENTRY |
|---|
| Title |
Springer eBooks |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Relationship information |
Printed edition: |
| International Standard Book Number |
9783642035340 |
| 830 #0 - ASIENTO SECUNDARIO DE SERIE--TITULO UNIFORME |
|---|
| Uniform title |
NanoScience and Technology, |
| International Standard Serial Number |
1434-4904 |
| 856 40 - LOCALIZACIÓN Y ACCESO ELECTRÓNICOS |
|---|
| Public note |
Libro electrónico |
| Uniform Resource Identifier |
<a href="http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-3-642-03535-7">http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-3-642-03535-7</a> |
| 942 ## - TIPO DE MATERIAL (KOHA) |
|---|
| Koha item type |
Libro Electrónico |
