MARC details
000 -LÍDER |
fixed length control field |
03755cam a2200613Ma 4500 |
001 - NÚMERO DE CONTROL |
control field |
u380146 |
003 - IDENTIFICADOR DEL NÚMERO DE CONTROL |
control field |
SIRSI |
005 - FECHA Y HORA DE LA ULTIMA TRANSACCIÓN |
control field |
20160812084633.0 |
006 - ELEMENTOS DE LONGITUD FIJA - CARACTERÍSTICAS DE MATERIALES ADICIONALES - INFORMACIÓN GENERAL |
fixed length control field |
m o d |
007 - CAMPO FIJO DE DESCRIPCIÓN FIJA--INFORMACIÓN GENERAL |
fixed length control field |
cr cnu---unuuu |
008 - ELEMENTOS DE LONGITUD FIJA -- INFORMACIÓN GENERAL |
fixed length control field |
131130s2014 enk ob 000 0 eng d |
040 ## - FUENTE DE CATALOGACIÓN |
Original cataloging agency |
EBLCP |
Language of cataloging |
eng |
Description conventions |
pn |
Transcribing agency |
EBLCP |
Modifying agency |
OCLCO |
-- |
OPELS |
-- |
NT |
-- |
YDXCP |
-- |
OCLCQ |
-- |
UPM |
-- |
B24X7 |
-- |
COO |
-- |
OCLCF |
-- |
OCLCQ |
020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS |
International Standard Book Number |
9780323241434 |
Qualifying information |
(electronic bk.) |
020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS |
International Standard Book Number |
0323241433 |
Qualifying information |
(electronic bk.) |
020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS |
International Standard Book Number |
9780128000175 |
Qualifying information |
(electronic bk.) |
020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS |
International Standard Book Number |
0128000171 |
Qualifying information |
(electronic bk.) |
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC) |
OCLC library identifier |
DEBSZ |
System control number |
405352131 |
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC) |
OCLC library identifier |
NLGGC |
System control number |
370564227 |
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC) |
OCLC library identifier |
NZ1 |
System control number |
15341982 |
050 #4 - SIGNATURA TOPOGRÁFICA DE LA BIBLIOTECA DEL CONGRESO |
Classification number |
QA76.9.A73 |
Item number |
.Z384 2013 |
082 04 - NÚMERO DE CLASIFICACIÓN DECIMAL DEWEY |
Classification number |
621.381 |
049 ## - LOCAL HOLDINGS (OCLC) |
Holding library |
TEFA |
100 1# - ASIENTO PRINCIPAL--NOMBRE PERSONAL |
Personal name |
Zalevsky, Zeev. |
245 10 - MENCIÓN DE TITULO |
Title |
New approaches to image processing based failure analysis of nano-scale ULSI devices |
Medium |
[recurso electrónico] / |
Statement of responsibility, etc. |
Zeev Zalevsky, Pavel Livshits, Eran Gur. |
260 ## - PUBLICACIÓN, DISTRIBUCIÓN, ETC. (PIE DE IMPRENTA) |
Place of publication, distribution, etc. |
Oxford : |
Name of publisher, distributor, etc. |
William Andrew, |
Date of publication, distribution, etc. |
2014. |
300 ## - DESCRIPCIÓN FÍSICA |
Extent |
1 online resource (179 pages). |
336 ## - CONTENT TYPE |
Content type term |
text |
Content type code |
txt |
Source |
rdacontent |
337 ## - MEDIA TYPE |
Media type term |
computer |
Media type code |
c |
Source |
rdamedia |
338 ## - CARRIER TYPE |
Carrier type term |
online resource |
Carrier type code |
cr |
Source |
rdacarrier |
490 1# - MENCIÓN DE SERIE |
Series statement |
Micro and Nano Technologies |
520 ## - NOTA DE RESUMEN, ETC. |
Summary, etc. |
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can't keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise. |
588 0# - SOURCE OF DESCRIPTION NOTE |
Source of description note |
Print version record. |
505 0# - NOTA DE CONTENIDO |
Formatted contents note |
Machine generated contents note: 1. Introduction -- 1.1. Basics of Image Processing -- 1.2. The Problems of Shrinking Feature Size in ULSI Development and Failure Analysis -- 1.3. High Resolution Imaging of Structures -- 1.4. Fabrication Techniques in ULSI Industry -- References -- 2. New Image Processing Methods for Advanced Metallization in Micro- and Nano-Electronics -- 2.1. Characteristics of Metal Ultrathin Films' Microstructures -- 2.2. Increased Productivity by Obviating Steps of Selection of Measurement Conditions -- 2.3. Demonstration of Method Capabilities -- References -- 3. New Super Resolving Techniques and Methods for Microelectronics -- 3.1. The Basics of Super Resolution -- 3.2. Super-Resolution Imaging for Improved Failure Analysis -- 3.3. Usage of Radon Transform for Improved Failure Analysis. |
504 ## - NOTA DE BIBLIOGRAFÍA, ETC. |
Bibliography, etc |
Includes bibliographical references. |
596 ## - |
-- |
19 |
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Integrated circuits |
General subdivision |
Ultra large scale integration |
-- |
Testing. |
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Nanoelectronics. |
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Microelectronics. |
650 #4 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Molecular electronics. |
650 #4 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Nano-Electronics. |
650 #4 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Nanotechnology. |
650 #7 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
TECHNOLOGY & ENGINEERING |
General subdivision |
Mechanical. |
Source of heading or term |
bisacsh |
650 #7 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Integrated circuits |
General subdivision |
Ultra large scale integration |
-- |
Testing. |
Source of heading or term |
fast |
Authority record control number |
(OCoLC)fst00975599 |
650 #7 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Microelectronics. |
Source of heading or term |
fast |
Authority record control number |
(OCoLC)fst01019757 |
650 #7 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
Topical term or geographic name as entry element |
Nanoelectronics. |
Source of heading or term |
fast |
Authority record control number |
(OCoLC)fst01741867 |
655 #4 - |
-- |
Electronic books. |
700 1# - ASIENTO SECUNDARIO - NOMBRE PERSONAL |
Personal name |
Livshits, Pavel. |
700 1# - ASIENTO SECUNDARIO - NOMBRE PERSONAL |
Personal name |
Gur, Eran. |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
Relationship information |
Print version: |
Main entry heading |
Zalevsky, Zeev. |
Title |
New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices. |
Place, publisher, and date of publication |
Burlington : Elsevier Science, 2013 |
International Standard Book Number |
9780323241434 |
830 #0 - ASIENTO SECUNDARIO DE SERIE--TITULO UNIFORME |
Uniform title |
Micro & nano technologies. |
856 40 - LOCALIZACIÓN Y ACCESO ELECTRÓNICOS |
Public note |
Libro electrónico |
Materials specified |
ScienceDirect |
Uniform Resource Identifier |
<a href="http://148.231.10.114:2048/login?url=http://www.sciencedirect.com/science/book/9780323241434">http://148.231.10.114:2048/login?url=http://www.sciencedirect.com/science/book/9780323241434</a> |
942 ## - TIPO DE MATERIAL (KOHA) |
Koha item type |
Libro Electrónico |