New approaches to image processing based failure analysis of nano-scale ULSI devices (Registro nro. 207067)

MARC details
000 -LÍDER
fixed length control field 03755cam a2200613Ma 4500
001 - NÚMERO DE CONTROL
control field u380146
003 - IDENTIFICADOR DEL NÚMERO DE CONTROL
control field SIRSI
005 - FECHA Y HORA DE LA ULTIMA TRANSACCIÓN
control field 20160812084633.0
006 - ELEMENTOS DE LONGITUD FIJA - CARACTERÍSTICAS DE MATERIALES ADICIONALES - INFORMACIÓN GENERAL
fixed length control field m o d
007 - CAMPO FIJO DE DESCRIPCIÓN FIJA--INFORMACIÓN GENERAL
fixed length control field cr cnu---unuuu
008 - ELEMENTOS DE LONGITUD FIJA -- INFORMACIÓN GENERAL
fixed length control field 131130s2014 enk ob 000 0 eng d
040 ## - FUENTE DE CATALOGACIÓN
Original cataloging agency EBLCP
Language of cataloging eng
Description conventions pn
Transcribing agency EBLCP
Modifying agency OCLCO
-- OPELS
-- NT
-- YDXCP
-- OCLCQ
-- UPM
-- B24X7
-- COO
-- OCLCF
-- OCLCQ
020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS
International Standard Book Number 9780323241434
Qualifying information (electronic bk.)
020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS
International Standard Book Number 0323241433
Qualifying information (electronic bk.)
020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS
International Standard Book Number 9780128000175
Qualifying information (electronic bk.)
020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS
International Standard Book Number 0128000171
Qualifying information (electronic bk.)
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC)
OCLC library identifier DEBSZ
System control number 405352131
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC)
OCLC library identifier NLGGC
System control number 370564227
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC)
OCLC library identifier NZ1
System control number 15341982
050 #4 - SIGNATURA TOPOGRÁFICA DE LA BIBLIOTECA DEL CONGRESO
Classification number QA76.9.A73
Item number .Z384 2013
082 04 - NÚMERO DE CLASIFICACIÓN DECIMAL DEWEY
Classification number 621.381
049 ## - LOCAL HOLDINGS (OCLC)
Holding library TEFA
100 1# - ASIENTO PRINCIPAL--NOMBRE PERSONAL
Personal name Zalevsky, Zeev.
245 10 - MENCIÓN DE TITULO
Title New approaches to image processing based failure analysis of nano-scale ULSI devices
Medium [recurso electrónico] /
Statement of responsibility, etc. Zeev Zalevsky, Pavel Livshits, Eran Gur.
260 ## - PUBLICACIÓN, DISTRIBUCIÓN, ETC. (PIE DE IMPRENTA)
Place of publication, distribution, etc. Oxford :
Name of publisher, distributor, etc. William Andrew,
Date of publication, distribution, etc. 2014.
300 ## - DESCRIPCIÓN FÍSICA
Extent 1 online resource (179 pages).
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
490 1# - MENCIÓN DE SERIE
Series statement Micro and Nano Technologies
520 ## - NOTA DE RESUMEN, ETC.
Summary, etc. New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can't keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise.
588 0# - SOURCE OF DESCRIPTION NOTE
Source of description note Print version record.
505 0# - NOTA DE CONTENIDO
Formatted contents note Machine generated contents note: 1. Introduction -- 1.1. Basics of Image Processing -- 1.2. The Problems of Shrinking Feature Size in ULSI Development and Failure Analysis -- 1.3. High Resolution Imaging of Structures -- 1.4. Fabrication Techniques in ULSI Industry -- References -- 2. New Image Processing Methods for Advanced Metallization in Micro- and Nano-Electronics -- 2.1. Characteristics of Metal Ultrathin Films' Microstructures -- 2.2. Increased Productivity by Obviating Steps of Selection of Measurement Conditions -- 2.3. Demonstration of Method Capabilities -- References -- 3. New Super Resolving Techniques and Methods for Microelectronics -- 3.1. The Basics of Super Resolution -- 3.2. Super-Resolution Imaging for Improved Failure Analysis -- 3.3. Usage of Radon Transform for Improved Failure Analysis.
504 ## - NOTA DE BIBLIOGRAFÍA, ETC.
Bibliography, etc Includes bibliographical references.
596 ## -
-- 19
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Integrated circuits
General subdivision Ultra large scale integration
-- Testing.
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Nanoelectronics.
650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Microelectronics.
650 #4 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Molecular electronics.
650 #4 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Nano-Electronics.
650 #4 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Nanotechnology.
650 #7 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element TECHNOLOGY & ENGINEERING
General subdivision Mechanical.
Source of heading or term bisacsh
650 #7 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Integrated circuits
General subdivision Ultra large scale integration
-- Testing.
Source of heading or term fast
Authority record control number (OCoLC)fst00975599
650 #7 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Microelectronics.
Source of heading or term fast
Authority record control number (OCoLC)fst01019757
650 #7 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO
Topical term or geographic name as entry element Nanoelectronics.
Source of heading or term fast
Authority record control number (OCoLC)fst01741867
655 #4 -
-- Electronic books.
700 1# - ASIENTO SECUNDARIO - NOMBRE PERSONAL
Personal name Livshits, Pavel.
700 1# - ASIENTO SECUNDARIO - NOMBRE PERSONAL
Personal name Gur, Eran.
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Print version:
Main entry heading Zalevsky, Zeev.
Title New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices.
Place, publisher, and date of publication Burlington : Elsevier Science, 2013
International Standard Book Number 9780323241434
830 #0 - ASIENTO SECUNDARIO DE SERIE--TITULO UNIFORME
Uniform title Micro & nano technologies.
856 40 - LOCALIZACIÓN Y ACCESO ELECTRÓNICOS
Public note Libro electrónico
Materials specified ScienceDirect
Uniform Resource Identifier <a href="http://148.231.10.114:2048/login?url=http://www.sciencedirect.com/science/book/9780323241434">http://148.231.10.114:2048/login?url=http://www.sciencedirect.com/science/book/9780323241434</a>
942 ## - TIPO DE MATERIAL (KOHA)
Koha item type Libro Electrónico
Existencias
Estado de retiro Fuente de clasificación Colección Ubicación permanente Ubicación actual Fecha de ingreso Total Checkouts Signatura topográfica Código de barras Date last seen Número de copia Tipo de material
    Colección de Libros Electrónicos Biblioteca Electrónica Biblioteca Electrónica     QA76.9 .A73 .Z384 2013 380146-2001 12/08/2016 1 Libro Electrónico

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