MARC details
| 000 -LÍDER |
|---|
| fixed length control field |
03905cam a2200517Mi 4500 |
| 001 - NÚMERO DE CONTROL |
|---|
| control field |
u380453 |
| 003 - IDENTIFICADOR DEL NÚMERO DE CONTROL |
|---|
| control field |
SIRSI |
| 005 - FECHA Y HORA DE LA ULTIMA TRANSACCIÓN |
|---|
| control field |
20160812084649.0 |
| 006 - ELEMENTOS DE LONGITUD FIJA - CARACTERÍSTICAS DE MATERIALES ADICIONALES - INFORMACIÓN GENERAL |
|---|
| fixed length control field |
m o d |
| 007 - CAMPO FIJO DE DESCRIPCIÓN FIJA--INFORMACIÓN GENERAL |
|---|
| fixed length control field |
cr |n||||||||| |
| 008 - ELEMENTOS DE LONGITUD FIJA -- INFORMACIÓN GENERAL |
|---|
| fixed length control field |
130109s2012 vtu o 000 0 eng d |
| 040 ## - FUENTE DE CATALOGACIÓN |
|---|
| Original cataloging agency |
EBLCP |
| Language of cataloging |
eng |
| Description conventions |
pn |
| Transcribing agency |
EBLCP |
| Modifying agency |
OCLCO |
| -- |
OCLCQ |
| -- |
NT |
| -- |
OPELS |
| -- |
OCLCQ |
| -- |
YDXCP |
| -- |
IDEBK |
| -- |
OCLCQ |
| -- |
UKDOC |
| -- |
OCLCQ |
| 020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS |
|---|
| International Standard Book Number |
9781455730599 (electronic bk.) |
| 020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS |
|---|
| International Standard Book Number |
1455730599 (electronic bk.) |
| 020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS |
|---|
| International Standard Book Number |
9781455730582 (electronic bk.) |
| 020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS |
|---|
| International Standard Book Number |
1455730580 (electronic bk.) |
| 029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC) |
|---|
| OCLC library identifier |
AU@ |
| System control number |
000050608479 |
| 029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC) |
|---|
| OCLC library identifier |
DEBSZ |
| System control number |
405346417 |
| 029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC) |
|---|
| OCLC library identifier |
NZ1 |
| System control number |
15190919 |
| 050 #4 - SIGNATURA TOPOGRÁFICA DE LA BIBLIOTECA DEL CONGRESO |
|---|
| Classification number |
QC173.4.P65 .Q384 2012 |
| 082 04 - NÚMERO DE CLASIFICACIÓN DECIMAL DEWEY |
|---|
| Classification number |
620.5 |
| 049 ## - LOCAL HOLDINGS (OCLC) |
|---|
| Holding library |
TEFA |
| 100 1# - ASIENTO PRINCIPAL--NOMBRE PERSONAL |
|---|
| Personal name |
Klapetek, Petr. |
| 245 10 - MENCIÓN DE TITULO |
|---|
| Title |
Quantitative Data Processing in Scanning Probe Microscopy |
| Medium |
[recurso electrónico] : |
| Remainder of title |
SPM Applications for Nanometrology. |
| 260 ## - PUBLICACIÓN, DISTRIBUCIÓN, ETC. (PIE DE IMPRENTA) |
|---|
| Place of publication, distribution, etc. |
Burlington : |
| Name of publisher, distributor, etc. |
Elsevier Science, |
| Date of publication, distribution, etc. |
2012. |
| 300 ## - DESCRIPCIÓN FÍSICA |
|---|
| Extent |
1 online resource (335 pages). |
| 336 ## - CONTENT TYPE |
|---|
| Content type term |
text |
| Content type code |
txt |
| Source |
rdacontent |
| 337 ## - MEDIA TYPE |
|---|
| Media type term |
computer |
| Media type code |
c |
| Source |
rdamedia |
| 338 ## - CARRIER TYPE |
|---|
| Carrier type term |
online resource |
| Carrier type code |
cr |
| Source |
rdacarrier |
| 490 1# - MENCIÓN DE SERIE |
|---|
| Series statement |
Micro and Nano Technologies |
| 505 0# - NOTA DE CONTENIDO |
|---|
| Formatted contents note |
Motivation -- Instrumentation Principles -- Data Models -- Basic Data Processing* -- Dimensional Measurements* -- Force and Mechanical Properties -- Friction and Lateral Forces -- Electrostatic Fields* -- Magnetic Fields -- Local Current Measurements* -- Thermal Measurements -- Optical Measurements -- Sample Data Files -- Numerical Modeling Techniques. |
| 520 ## - NOTA DE RESUMEN, ETC. |
|---|
| Summary, etc. |
Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected. In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website. |
| 588 0# - SOURCE OF DESCRIPTION NOTE |
|---|
| Source of description note |
Print version record. |
| 596 ## - |
|---|
| -- |
19 |
| 650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Scanning probe microscopy |
| General subdivision |
Data processing. |
| 650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Qualitative research |
| General subdivision |
Data processing. |
| 650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Scanning probe microscopy. |
| 650 #7 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
SCIENCE |
| General subdivision |
Nanoscience. |
| Source of heading or term |
bisacsh |
| 650 #7 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
TECHNOLOGY & ENGINEERING |
| General subdivision |
Nanotechnology & MEMS. |
| Source of heading or term |
bisacsh |
| 655 #4 - |
|---|
| -- |
Electronic books. |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Relationship information |
Print version: |
| Main entry heading |
Klapetek, Petr. |
| Title |
Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology. |
| Place, publisher, and date of publication |
Burlington : Elsevier Science, 2012 |
| International Standard Book Number |
9781455730582 |
| 830 #0 - ASIENTO SECUNDARIO DE SERIE--TITULO UNIFORME |
|---|
| Uniform title |
Micro & nano technologies. |
| 856 40 - LOCALIZACIÓN Y ACCESO ELECTRÓNICOS |
|---|
| Public note |
Libro electrónico |
| Materials specified |
ScienceDirect |
| Uniform Resource Identifier |
<a href="http://148.231.10.114:2048/login?url=http://www.sciencedirect.com/science/book/9781455730582">http://148.231.10.114:2048/login?url=http://www.sciencedirect.com/science/book/9781455730582</a> |
| 942 ## - TIPO DE MATERIAL (KOHA) |
|---|
| Koha item type |
Libro Electrónico |
