MARC details
| 000 -LIDER |
|---|
| fixed length control field |
04412nam a22005535i 4500 |
| 001 - CONTROL NUMBER |
|---|
| control field |
978-3-031-59361-1 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
DE-He213 |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20250516160102.0 |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
|---|
| fixed length control field |
cr nn 008mamaa |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
240712s2024 sz | s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9783031593611 |
| -- |
978-3-031-59361-1 |
| 050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
|---|
| Classification number |
TK7867-7867.5 |
| 072 #7 - SUBJECT CATEGORY CODE |
|---|
| Subject category code |
TJFC |
| Source |
bicssc |
| 072 #7 - SUBJECT CATEGORY CODE |
|---|
| Subject category code |
TEC008010 |
| Source |
bisacsh |
| 072 #7 - SUBJECT CATEGORY CODE |
|---|
| Subject category code |
TJFC |
| Source |
thema |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.3815 |
| Edition number |
23 |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Recent Advances in Microelectronics Reliability |
| Medium |
[electronic resource] : |
| Remainder of title |
Contributions from the European ECSEL JU project iRel40 / |
| Statement of responsibility, etc. |
edited by Willem Dirk van Driel, Klaus Pressel, Mujdat Soyturk. |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
1st ed. 2024. |
| 264 #1 - |
|---|
| -- |
Cham : |
| -- |
Springer International Publishing : |
| -- |
Imprint: Springer, |
| -- |
2024. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
XIII, 403 p. 196 illus., 171 illus. in color. |
| Other physical details |
online resource. |
| 336 ## - |
|---|
| -- |
text |
| -- |
txt |
| -- |
rdacontent |
| 337 ## - |
|---|
| -- |
computer |
| -- |
c |
| -- |
rdamedia |
| 338 ## - |
|---|
| -- |
online resource |
| -- |
cr |
| -- |
rdacarrier |
| 347 ## - |
|---|
| -- |
text file |
| -- |
PDF |
| -- |
rda |
| 505 0# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Chapter 1. Material characterization -- Chapter 2. Smart optical inline metrology -- Chapter 3. Automated classification of semiconductor defect density SEM images using deep learning -- Chapter 4. An Artificial Intelligence-based Framework for Burn-in Reduction in the Semiconductor Manufacturing Industry -- Chapter 5. An Artificial Intelligence-based Framework for Burn-in Reduction in the Semiconductor Manufacturing Industry -- Chapter 6. Early Lifetime Estimation for Automotive Lidar using Realistic L4 Usage Profiles -- Chapter 7. Improving the reliability of automotive sensors -- Chapter 8. Reliability improvements for in-wheel motor -- Chapter 9. Big Data Streaming and Data Analytics Infrastructure for Efficient AI-Based Processing -- Chapter 10. An Outlook on Power Electronics Reliability and Reliability Monitoring -- Chapter 11. Digital Twin Technology in Electronics -- Chapter 12. A Framework for Applying Data-driven AI/ML Models in Reliability. Chapter 13. Health monitoring fatigue properties of solder Interconnects in LED drivers -- Chapter 14. Compiling Hybrid Models for embedded architectures using TensorflowLite for Microcontrollers -- Chapter 15. Design support for reliable integrated circuits -- Chapter 16. Outlook: the future of reliability. |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc. |
This book describes the latest progress in reliability analysis of microelectronic products. The content grows out of an EU project, named Intelligent Reliability 4.0 - iRel40 (see www.irel40.eu ). Different industrial sectors and topics are covered, such as electronics in automotive, rail transport, lighting and personal appliances. Several case studies and examples are discussed, which will enable readers to assess and mitigate similar failure cases. More importantly, this book tries to present methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of electronic devices. Describes state-of-the-art methodologies for analyzing the reliability, failure, and degradation of electronic devices; Discusses how to correlate electronic processing and performance to reliability and lifetime; Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of electronic devices. |
| 541 ## - IMMEDIATE SOURCE OF ACQUISITION NOTE |
|---|
| Owner |
UABC ; |
| Method of acquisition |
Perpetuidad |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Término temático o nombre geográfico como elemento de entrada |
Electronic circuits. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Término temático o nombre geográfico como elemento de entrada |
Electronic circuit design. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Término temático o nombre geográfico como elemento de entrada |
Solid state physics. |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Término temático o nombre geográfico como elemento de entrada |
Electronic Circuits and Systems. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Término temático o nombre geográfico como elemento de entrada |
Electronics Design and Verification. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Término temático o nombre geográfico como elemento de entrada |
Electronic Devices. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
van Driel, Willem Dirk. |
| Relator term |
editor. |
| Relator code |
edt |
| -- |
http://id.loc.gov/vocabulary/relators/edt |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Pressel, Klaus. |
| Relator term |
editor. |
| Relator code |
edt |
| -- |
http://id.loc.gov/vocabulary/relators/edt |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Soyturk, Mujdat. |
| Relator term |
editor. |
| Relator code |
edt |
| -- |
http://id.loc.gov/vocabulary/relators/edt |
| 710 2# - ADDED ENTRY--CORPORATE NAME |
|---|
| Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
| 773 0# - HOST ITEM ENTRY |
|---|
| Title |
Springer Nature eBook |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Relationship information |
Printed edition: |
| International Standard Book Number |
9783031593604 |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Relationship information |
Printed edition: |
| International Standard Book Number |
9783031593628 |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Relationship information |
Printed edition: |
| International Standard Book Number |
9783031593635 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Public note |
Libro electrónico |
| Uniform Resource Identifier |
http://libcon.rec.uabc.mx:2048/login?url=https://doi.org/10.1007/978-3-031-59361-1 |
| 912 ## - |
|---|
| -- |
ZDB-2-ENG |
| 912 ## - |
|---|
| -- |
ZDB-2-SXE |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Koha item type |
Libro Electrónico |
