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Advanced Test Methods for SRAMs [recurso electrónico] : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel.

Por: Bosio, Alberto [author.]Colaborador(es): Dilillo, Luigi [author.] | Girard, Patrick [author.] | Pravossoudovitch, Serge [author.] | Virazel, Arnaud [author.] | SpringerLink (Online service)Tipo de material: Texto

TextoEditor: Boston, MA : Springer US, 2010Edición: 1Descripción: XV, 171 p. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9781441909381Tema(s): Engineering | Computer aided design | Systems engineering | Engineering | Circuits and Systems | Computer-Aided Engineering (CAD, CAE) and DesignFormatos físicos adicionales: Printed edition:: Sin títuloClasificación CDD: 621.3815 Clasificación LoC:TK7888.4Recursos en línea: Libro electrónico Texto

Contenidos:

Basics on SRAM Testing -- Resistive-Open Defects in Core-Cells -- Resistive-Open Defects in Pre-charge Circuits -- Resistive-Open Defects in Address Decoders -- Resistive-Open Defects in Write Drivers -- Resistive-Open Defects in Sense Amplifiers -- Faults Due to Process Variations in SRAMs -- Diagnosis and Design-for-Diagnosis.

En: Springer eBooksResumen: Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book. First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories; Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies; Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.); Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling.

Existencias ( 1 )
Notas de título ( 3 )

Existencias
Tipo de ítem	Biblioteca actual	Colección	Signatura	Copia número	Estado	Fecha de vencimiento	Código de barras
Libro Electrónico	Biblioteca Electrónica	Colección de Libros Electrónicos	TK7888.4 (Browse shelf(Abre debajo))	1	No para préstamo		371209-2001

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Previo	TK7888.4 Quantifying and Exploring the Gap Between FPGAs and ASICs	TK7888.4 Power-Aware Testing and Test Strategies for Low Power Devices	TK7888.4 Analysis and Design of Resilient VLSI Circuits	TK7888.4 Advanced Test Methods for SRAMs	TK7888.4 Designing Embedded Systems with the SIGNAL Programming Language	TK7888.4 Hardware Acceleration of EDA Algorithms	TK7888.4 On and Off-Chip Crosstalk Avoidance in VLSI Design	Siguiente

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book. First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories; Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies; Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.); Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling.