Sample Preparation Handbook for Transmission Electron Microscopy [recurso electrónico] : Techniques / by Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub.

Por: Ayache, Jeanne [author.]Colaborador(es): Beaunier, Luc [author.] | Boumendil, Jacqueline [author.] | Ehret, Gabrielle [author.] | Laub, Danièle [author.] | SpringerLink (Online service)Tipo de material: TextoTextoEditor: New York, NY : Springer New York : Imprint: Springer, 2010Descripción: XXV, 338 p. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9781441959751Tema(s): Mineralogy | Microscopy | Nanotechnology | Surfaces (Physics) | Materials Science | Characterization and Evaluation of Materials | Biological Microscopy | Mineralogy | NanotechnologyFormatos físicos adicionales: Printed edition:: Sin títuloClasificación CDD: 620.11 Clasificación LoC:TA404.6Recursos en línea: Libro electrónicoTexto
Contenidos:
Techniques: General Introduction -- Preliminary Preparation Techniques -- Thinning Preparation Techniques -- Mechanical Preparation Techniques -- Replica Techniques -- Techniques Specific to Fine Particles -- Contrast Enhancement and Labeling Techniques.
En: Springer eBooksResumen: This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. Sample Preparation Handbook for Transmission Electron Microscopy: Techniques describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis. Compatibility and pre-treatments are also discussed. Experimental conditions and guidelines, options and variations, advantages and constraints, technical hints from the authors’ years of experience, common artifacts, and theoretical issues are all considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. This practical and authoritative reference companion deserves a place on the bench in every TEM lab. Key Features of the Handbook: Combines all of the latest techniques for the preparation of mineral to biological samples Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level) Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis Links to a complementary interactive database website which is available to scientists worldwide* Written by authors with 100 years of combined experience in electron microscopy *http://temsamprep.in2p3.fr/
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Tipo de ítem Biblioteca actual Colección Signatura Copia número Estado Fecha de vencimiento Código de barras
Libro Electrónico Biblioteca Electrónica
Colección de Libros Electrónicos TA404.6 (Browse shelf(Abre debajo)) 1 No para préstamo 371547-2001

Techniques: General Introduction -- Preliminary Preparation Techniques -- Thinning Preparation Techniques -- Mechanical Preparation Techniques -- Replica Techniques -- Techniques Specific to Fine Particles -- Contrast Enhancement and Labeling Techniques.

This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. Sample Preparation Handbook for Transmission Electron Microscopy: Techniques describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis. Compatibility and pre-treatments are also discussed. Experimental conditions and guidelines, options and variations, advantages and constraints, technical hints from the authors’ years of experience, common artifacts, and theoretical issues are all considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. This practical and authoritative reference companion deserves a place on the bench in every TEM lab. Key Features of the Handbook: Combines all of the latest techniques for the preparation of mineral to biological samples Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level) Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis Links to a complementary interactive database website which is available to scientists worldwide* Written by authors with 100 years of combined experience in electron microscopy *http://temsamprep.in2p3.fr/

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