Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 [recurso electrónico] / edited by Bharat Bhushan.

Por: Bhushan, Bharat [editor.]Colaborador(es): SpringerLink (Online service)Tipo de material: Texto

TextoSeries NanoScience and TechnologyEditor: Berlin, Heidelberg : Springer Berlin Heidelberg, 2011Descripción: XXVI, 710p. 200 illus. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9783642104978Tema(s): Engineering | Nanotechnology | Surfaces (Physics) | Materials Science | Nanotechnology | Characterization and Evaluation of Materials | Surfaces and Interfaces, Thin Films | Nanotechnology and Microengineering | Condensed Matter Physics | Biophysics and Biological PhysicsFormatos físicos adicionales: Printed edition:: Sin títuloClasificación CDD: 620.115 Clasificación LoC:T174.7TA418.9.N35Recursos en línea: Libro electrónico Texto

En: Springer eBooksResumen: This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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Notas de título ( 2 )

Existencias
Tipo de ítem	Biblioteca actual	Colección	Signatura	Copia número	Estado	Fecha de vencimiento	Código de barras
Libro Electrónico	Biblioteca Electrónica	Colección de Libros Electrónicos	T174.7 (Browse shelf(Abre debajo))	1	No para préstamo		373809-2001

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This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.