Nanotribology and Nanomechanics I [recurso electrónico] : Measurement Techniques and Nanomechanics / edited by Bharat Bhushan.

Por: Bhushan, Bharat [editor.]Colaborador(es): SpringerLink (Online service)Tipo de material: TextoTextoEditor: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2011Descripción: XVIII, 623 p. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9783642152832Tema(s): Engineering | Nanotechnology | Engineering | Nanotechnology and Microengineering | Nanotechnology | Nanoscale Science and TechnologyFormatos físicos adicionales: Printed edition:: Sin títuloClasificación CDD: 620.5 Clasificación LoC:T174.7Recursos en línea: Libro electrónicoTexto
Contenidos:
Introduction - Measurement Techniques and Applications -- Scanning Probe Microscopy - Principle of Operation, Instrumentation and Probes -- General and Special Probes in Scanning Microscopies -- Force Calibration Techniques for AFM Cantilevers -- Noncontact Atomic Force Microscopy and Related Topics -- Low Temperature Scanning Probe Microscopy -- Dynamic Modes of Atomic Force Microscopy -- Molecular Single Molecular Recognition Force Spectroscopy and Imaging -- Nanomechanical Properties of Solid Surfaces and Thin Films -- Computer Simulations of Nanometer-Scale Indentation and Friction.
En: Springer eBooksResumen: The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.
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Tipo de ítem Biblioteca actual Colección Signatura Copia número Estado Fecha de vencimiento Código de barras
Libro Electrónico Biblioteca Electrónica
Colección de Libros Electrónicos T174.7 (Browse shelf(Abre debajo)) 1 No para préstamo 374988-2001

Introduction - Measurement Techniques and Applications -- Scanning Probe Microscopy - Principle of Operation, Instrumentation and Probes -- General and Special Probes in Scanning Microscopies -- Force Calibration Techniques for AFM Cantilevers -- Noncontact Atomic Force Microscopy and Related Topics -- Low Temperature Scanning Probe Microscopy -- Dynamic Modes of Atomic Force Microscopy -- Molecular Single Molecular Recognition Force Spectroscopy and Imaging -- Nanomechanical Properties of Solid Surfaces and Thin Films -- Computer Simulations of Nanometer-Scale Indentation and Friction.

The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.

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