Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications [recurso electrónico] : 16th Iberoamerican Congress, CIARP 2011, Pucón, Chile, November 15-18, 2011. Proceedings / edited by César San Martin, Sang-Woon Kim.
Tipo de material: TextoSeries Lecture Notes in Computer Science ; 7042Editor: Berlin, Heidelberg : Springer Berlin Heidelberg, 2011Descripción: XVIII, 721p. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9783642250859Tema(s): Computer science | Computer software | Artificial intelligence | Computer vision | Optical pattern recognition | Biometrics | Computer Science | Pattern Recognition | Image Processing and Computer Vision | Artificial Intelligence (incl. Robotics) | Biometrics | Algorithm Analysis and Problem Complexity | Information Systems Applications (incl. Internet)Formatos físicos adicionales: Printed edition:: Sin títuloClasificación CDD: 006.4 Clasificación LoC:Q337.5TK7882.P3Recursos en línea: Libro electrónico En: Springer eBooksResumen: This book constitutes the refereed proceedings of the 16th Iberoamerican Congress on Pattern Recognition, CIARP 2011, held in Pucón, Chile, in November 2011. The 81 revised full papers presented together with 3 keynotes were carefully reviewed and selected from numerous submissions. Topics of interest covered are image processing, restoration and segmentation; computer vision; clustering and artificial intelligence; pattern recognition and classification; applications of pattern recognition; and Chilean Workshop on Pattern Recognition.Tipo de ítem | Biblioteca actual | Colección | Signatura | Copia número | Estado | Fecha de vencimiento | Código de barras |
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Libro Electrónico | Biblioteca Electrónica | Colección de Libros Electrónicos | Q337.5 (Browse shelf(Abre debajo)) | 1 | No para préstamo | 376861-2001 |
This book constitutes the refereed proceedings of the 16th Iberoamerican Congress on Pattern Recognition, CIARP 2011, held in Pucón, Chile, in November 2011. The 81 revised full papers presented together with 3 keynotes were carefully reviewed and selected from numerous submissions. Topics of interest covered are image processing, restoration and segmentation; computer vision; clustering and artificial intelligence; pattern recognition and classification; applications of pattern recognition; and Chilean Workshop on Pattern Recognition.
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