Microwave de-embedding [recurso electrónico] : from theory to applications / Giovanni Crupi, Dominique M.M.-P. Schreurs.

Por: Crupi, GiovanniColaborador(es): Schreurs, DominiqueTipo de material: TextoTextoDetalles de publicación: Oxford : Academic Press, 2014Descripción: 1 online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 1306133165 (electronic bk.); 9781306133166 (electronic bk.); 9780124017009 (electronic bk.); 0124017002 (electronic bk.)Tema(s): Microwave circuits | Microwave circuitsGénero/Forma: Electronic books.Formatos físicos adicionales: Print version:: Sin títuloClasificación CDD: 621.381/32 Clasificación LoC:TK7876Recursos en línea: Libro electrónico ScienceDirectTexto
Contenidos:
A clear-cut introduction to the de-embedding concept: less is more / Givanni Crupi, Dominique M.M.-P. Schreurs, Alina Caddemi -- Millimeter- wave characterization of silicon devices under small-signal regime: instruments and measurement methodologies / Gilles Dambrine -- Characterization and modeling of high-frequency active devices oriented to high-sensitivity subsystems design / Ernesto Limiti, Walter Ciccognani, Sergio Colangeli -- High-frequency and microwave electromagnetic analysis calibration and de-embedding / James C. Rautio -- Large-signal time-domain waveform-based transistor modeling / Itcho Angelov, Gustavo Avolio, Dominique M.M. -P. Schreurs -- Measuring and characterization nonlinear radio-frequency systems / Wendy Van Moer, Lieve Lauwers, Kurt Barbe -- Behavioral models for microwave circuit design / Jose C. Pedro, Telmo R. Cunha -- Electromagnetic-analysis-based transitor de-embedding and related radio-frequency amplifier design / Manuel Yarleque, Dominique M.M.-P. Schruers, Bart Nauwelaers, Davide Resca, Giorgio Vannini -- Nonlinear embedding and de-embedding: theory and applications / Antonio Raffo, Valeria Vadala, Giorgio Vannini.
Resumen: This book is the first to give an introduction to microwave de-embedding, showing how it is the cornerstone for waveform engineering. The authors of each chapter clearly explain the theoretical concepts, providing a foundation that supports linear and non-linear measurements, modelling and circuit design. Recent developments and future trends in the field are covered throughout, including successful strategies for low-noise and power amplifier design. This book is a must-have for those wishing to understand the full potential of the microwave de-embedding concept to achieve successful results in the areas of measurements, modelling, and design at high frequencies. With this book you will learn: The theoretical background of high-frequency de-embedding for measurements, modelling, and design. Details on applying the de-embedding concept to the transistor's linear, non-linear, and noise behaviour. The impact of de-embedding on low-noise and power amplifier design. The recent advances and future trends in the field of high-frequency de-embedding. Presents the theory and practice of microwave de-embedding, from the basic principles to recent advances and future trends. Written by experts in the field, all of whom are leading researchers in the area. Each chapter describes theoretical background and gives experimental results and practical applications.
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Existencias
Tipo de ítem Biblioteca actual Colección Signatura Copia número Estado Fecha de vencimiento Código de barras
Libro Electrónico Biblioteca Electrónica
Colección de Libros Electrónicos TK7876 (Browse shelf(Abre debajo)) 1 No para préstamo 380153-2001

This book is the first to give an introduction to microwave de-embedding, showing how it is the cornerstone for waveform engineering. The authors of each chapter clearly explain the theoretical concepts, providing a foundation that supports linear and non-linear measurements, modelling and circuit design. Recent developments and future trends in the field are covered throughout, including successful strategies for low-noise and power amplifier design. This book is a must-have for those wishing to understand the full potential of the microwave de-embedding concept to achieve successful results in the areas of measurements, modelling, and design at high frequencies. With this book you will learn: The theoretical background of high-frequency de-embedding for measurements, modelling, and design. Details on applying the de-embedding concept to the transistor's linear, non-linear, and noise behaviour. The impact of de-embedding on low-noise and power amplifier design. The recent advances and future trends in the field of high-frequency de-embedding. Presents the theory and practice of microwave de-embedding, from the basic principles to recent advances and future trends. Written by experts in the field, all of whom are leading researchers in the area. Each chapter describes theoretical background and gives experimental results and practical applications.

Includes index.

Description based on print version record.

Includes bibliographical references and index.

A clear-cut introduction to the de-embedding concept: less is more / Givanni Crupi, Dominique M.M.-P. Schreurs, Alina Caddemi -- Millimeter- wave characterization of silicon devices under small-signal regime: instruments and measurement methodologies / Gilles Dambrine -- Characterization and modeling of high-frequency active devices oriented to high-sensitivity subsystems design / Ernesto Limiti, Walter Ciccognani, Sergio Colangeli -- High-frequency and microwave electromagnetic analysis calibration and de-embedding / James C. Rautio -- Large-signal time-domain waveform-based transistor modeling / Itcho Angelov, Gustavo Avolio, Dominique M.M. -P. Schreurs -- Measuring and characterization nonlinear radio-frequency systems / Wendy Van Moer, Lieve Lauwers, Kurt Barbe -- Behavioral models for microwave circuit design / Jose C. Pedro, Telmo R. Cunha -- Electromagnetic-analysis-based transitor de-embedding and related radio-frequency amplifier design / Manuel Yarleque, Dominique M.M.-P. Schruers, Bart Nauwelaers, Davide Resca, Giorgio Vannini -- Nonlinear embedding and de-embedding: theory and applications / Antonio Raffo, Valeria Vadala, Giorgio Vannini.

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