Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing [electronic resource] / by Jeffrey Prinzie, Michiel Steyaert, Paul Leroux.

Por: Prinzie, Jeffrey [author.]Colaborador(es): Steyaert, Michiel [author.] | Leroux, Paul [author.] | SpringerLink (Online service)Tipo de material: TextoTextoSeries Analog Circuits and Signal ProcessingEditor: Cham : Springer International Publishing : Imprint: Springer, 2018Edición: 1st ed. 2018Descripción: XXV, 183 p. 150 illus., 17 illus. in color. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9783319786162Tema(s): Electronic circuits | Signal processing | Image processing | Speech processing systems | Electronics | Microelectronics | Circuits and Systems | Signal, Image and Speech Processing | Electronics and Microelectronics, InstrumentationFormatos físicos adicionales: Printed edition:: Sin título; Printed edition:: Sin título; Printed edition:: Sin títuloClasificación CDD: 621.3815 Clasificación LoC:TK7888.4Recursos en línea: Libro electrónicoTexto
Contenidos:
Introduction -- Radiation Effects in CMOS Technology -- Time-Domain Signal Processing -- Clock Synthesizers -- Single Shot Time-to-Digital Converters -- Low Jitter Clock Generators -- Radiation experiments on CMOS PLLs -- Radiation Hard Frequency Synthesizers -- Conclusion.
En: Springer Nature eBookResumen: This book presents state-of-the-art techniques for radiation hardened high-resolution Time-to-Digital converters and low noise frequency synthesizers. Throughout the book, advanced degradation mechanisms and error sources are discussed and several ways to prevent such errors are presented. An overview of the prerequisite physics of nuclear interactions is given that has been compiled in an easy to understand chapter. The book is structured in a way that different hardening techniques and solutions are supported by theory and experimental data with their various tradeoffs. Based on leading-edge research, conducted in collaboration between KU Leuven and CERN, the European Center for Nuclear Research Describes in detail advanced techniques to harden circuits against ionizing radiation Provides a practical way to learn and understand radiation effects in time-based circuits Includes an introduction to the underlying physics, circuit design, and advanced techniques accompanied with experimental data.
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Acceso multiusuario

Introduction -- Radiation Effects in CMOS Technology -- Time-Domain Signal Processing -- Clock Synthesizers -- Single Shot Time-to-Digital Converters -- Low Jitter Clock Generators -- Radiation experiments on CMOS PLLs -- Radiation Hard Frequency Synthesizers -- Conclusion.

This book presents state-of-the-art techniques for radiation hardened high-resolution Time-to-Digital converters and low noise frequency synthesizers. Throughout the book, advanced degradation mechanisms and error sources are discussed and several ways to prevent such errors are presented. An overview of the prerequisite physics of nuclear interactions is given that has been compiled in an easy to understand chapter. The book is structured in a way that different hardening techniques and solutions are supported by theory and experimental data with their various tradeoffs. Based on leading-edge research, conducted in collaboration between KU Leuven and CERN, the European Center for Nuclear Research Describes in detail advanced techniques to harden circuits against ionizing radiation Provides a practical way to learn and understand radiation effects in time-based circuits Includes an introduction to the underlying physics, circuit design, and advanced techniques accompanied with experimental data.

UABC ; Temporal ; 01/01/2021-12/31/2023.

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