TY  - BOOK
AU  - Franceschini,Fiorenzo
AU  - Galetto,Maurizio
AU  - Maisano,Domenico
AU  - Mastrogiacomo,Luca
AU  - Pralio,Barbara
ED  - SpringerLink (Online service)
TI  - Distributed Large-Scale Dimensional Metrology: New Insights 
SN  - 9780857295439
AV  - TJ241 
U1  - 670 23
PY  - 2011///
CY  - London
PB  - Springer London
KW  - Engineering
KW  - Computer aided design
KW  - Machinery
KW  - Manufacturing, Machines, Tools
KW  - Measurement Science and Instrumentation
KW  - Mathematical Modeling and Industrial Mathematics
KW  - Computer-Aided Engineering (CAD, CAE) and Design
N1  - 1. LSM: The New Paradigm of Distributed Systems -- 2. Indoor GPS (iGPSTM) -- 3. The Mobile Spatial coordinate Measuring System (MScMS) -- 4. Positioning and Coverage of Distributed Devices -- 5. System Calibration -- 6. Self-Diagnostic Tools -- 7. Methodologies for Performance Enhancing -- 8. Evaluation of Measurement Uncertainty
N2  - The field of large-scale dimensional metrology (LSM) deals with objects that have linear dimensions ranging from tens to hundreds of meters. It has recently attracted a great deal of interest in many areas of production, including the automotive, railway, and shipbuilding sectors. Distributed Large-Scale Dimensional Metrology introduces a new paradigm in this field that reverses the classical metrological approach: measuring systems that are portable and can be easily moved around the location of the measured object, which is preferable to moving the object itself. Distributed Large-Scale Dimensional Metrology combines the concepts of distributed systems and large-scale metrology at the application level. It focuses on the latest insights and challenges of this new generation of systems from the perspective of the designers and developers. The main topics are: coverage of measuring area, sensors calibration, on-line diagnostics, probe management, and analysis of metrological performance. The general descriptions of each topic are further enriched by specific examples concerning the use of commercially available systems or the development of new prototypes. This will be particularly useful for professional practitioners such as quality engineers, manufacturing and development engineers, and procurement specialists, but Distributed Large-Scale Dimensional Metrology also has a wealth of information for interested academics
UR  - http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-0-85729-543-9
ER  -