TY  - BOOK
AU  - Sun,Yongke
AU  - Thompson,Scott E.
AU  - Nishida,Toshikazu
ED  - SpringerLink (Online service)
TI  - Strain Effect in Semiconductors: Theory and Device Applications 
SN  - 9781441905529
AV  - TK7800-8360 
U1  - 621.381 23
PY  - 2010///
CY  - Boston, MA
PB  - Springer US
KW  - Engineering
KW  - Electronics
KW  - Optical materials
KW  - Electronics and Microelectronics, Instrumentation
KW  - Solid State Physics
KW  - Spectroscopy and Microscopy
KW  - Optical and Electronic Materials
N1  - Overview: The Age of Strained Devices -- Band Structures of Strained Semiconductors -- Stress, Strain, Piezoresistivity, and Piezoelectricity -- Strain and Semiconductor Crystal Symmetry -- Band Structures of Strained Semiconductors -- Low-Dimensional Semiconductor Structures -- Transport Theory of Strained Semiconductors -- Semiconductor Transport -- Strain in Semiconductor Devices -- Strain in Electron Devices -- Piezoresistive Strain Sensors -- Strain Effects on Optoelectronic Devices
N2  - Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant applications of strain while also focusing on the fundamental physics as they pertain to bulk, planar, and scaled nano-devices. Lead authors Yongke Sun, Scott Thompson and Toshikazu Nishida also: Treat strain physics at both the qualitative overview level as well as provide detailed fundamentals Explain strain physics relevant to logic devices as well as strain-based MEMS This book is relevant to current strained Si logic technology, as well as for understanding the physics and scaling of future strain nano-scale devices. It is perfect for practicing device engineers at semiconductor manufacturers, as well as graduate students studying device physics at universities
UR  - http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-1-4419-0552-9
ER  -