TY  - BOOK
AU  - Cao,Yu
ED  - SpringerLink (Online service)
TI  - Predictive Technology Model for Robust Nanoelectronic Design
T2  - Integrated Circuits and Systems,
SN  - 9781461404453
AV  - TK7888.4 
U1  - 621.3815 23
PY  - 2011///
CY  - Boston, MA
PB  - Springer US
KW  - Engineering
KW  - Operating systems (Computers)
KW  - Electronics
KW  - Systems engineering
KW  - Nanotechnology
KW  - Circuits and Systems
KW  - Electronics and Microelectronics, Instrumentation
KW  - Performance and Reliability
N1  - 1. Introduction -- 2. Predictive Technology Model of Conventional CMOS Devices -- 3. Predictive Technology Model of Enhanced CMOS Devices -- 4. Statistical Extraction and Modeling of CMOS Variability -- 5. Modeling of Temporal Reliability Degradation -- 6. Modeling of Interconnect Parasitics -- 7. Design Benchmark with Predictive Technology Model -- 8. Predictive Process Design Kits -- 9. Predictive Modeling of Carbon Nanotube Devices -- 10. Predictive Technology Model for Future Nanoelectronic Design
N2  - Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling
UR  - http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-1-4614-0445-3
ER  -