TY  - BOOK
AU  - Breitenstein,Otwin
AU  - Warta,Wilhelm
AU  - Langenkamp,Martin
ED  - SpringerLink (Online service)
TI  - Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials 
T2  - Springer Series in Advanced Microelectronics,
SN  - 9783642024177
AV  - QC350-467 
U1  - 621.36 23
PY  - 2010///
CY  - Berlin, Heidelberg
PB  - Springer Berlin Heidelberg
KW  - Physics
KW  - Engineering
KW  - Materials
KW  - Surfaces (Physics)
KW  - Optics, Optoelectronics, Plasmonics and Optical Devices
KW  - Characterization and Evaluation of Materials
KW  - Engineering, general
KW  - Structural Materials
N1  - Introduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook
N2  - This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced
UR  - http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-3-642-02417-7
ER  -