TY  - BOOK
AU  - Leach,Richard
ED  - SpringerLink (Online service)
TI  - Optical Measurement of Surface Topography
SN  - 9783642120121
AV  - TA404.6 
U1  - 620.11 23
PY  - 2011///
CY  - Berlin, Heidelberg
PB  - Springer Berlin Heidelberg
KW  - Microwaves
KW  - Surfaces (Physics)
KW  - Materials Science
KW  - Characterization and Evaluation of Materials
KW  - Microwaves, RF and Optical Engineering
KW  - Measurement Science and Instrumentation
KW  - Surfaces and Interfaces, Thin Films
N1  - Introduction to surface texture measurement -- Some common terms and definitions -- Limitations of optical 3D sensors.- Calibration of optical surface topography measuring instruments.- Chromatic confocal microscopy -- Point autofocus instruments.- Focus variation instruments.- Phase shifting interferometry.-  Coherence scanning interferometry -- Digital holographic microscopy.- Imaging confocal microscopy.- Light scattering methods
N2  - The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manu­facturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies
UR  - http://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-3-642-12012-1
ER  -