TY  - BOOK
AU  - Zalevsky,Zeev
AU  - Livshits,Pavel
AU  - Gur,Eran
TI  - New approaches to image processing based failure analysis of nano-scale ULSI devices
T2  - Micro and Nano Technologies
SN  - 9780323241434
AV  - QA76.9.A73 .Z384 2013
U1  - 621.381 
PY  - 2014///
CY  - Oxford
PB  - William Andrew
KW  - Integrated circuits
KW  - Ultra large scale integration
KW  - Testing
KW  - Nanoelectronics
KW  - Microelectronics
KW  - Molecular electronics
KW  - Nano-Electronics
KW  - Nanotechnology
KW  - TECHNOLOGY & ENGINEERING
KW  - Mechanical
KW  - bisacsh
KW  - fast
KW  - Electronic books
N1  - Includes bibliographical references; Machine generated contents note: 1. Introduction -- 1.1. Basics of Image Processing -- 1.2. The Problems of Shrinking Feature Size in ULSI Development and Failure Analysis -- 1.3. High Resolution Imaging of Structures -- 1.4. Fabrication Techniques in ULSI Industry -- References -- 2. New Image Processing Methods for Advanced Metallization in Micro- and Nano-Electronics -- 2.1. Characteristics of Metal Ultrathin Films' Microstructures -- 2.2. Increased Productivity by Obviating Steps of Selection of Measurement Conditions -- 2.3. Demonstration of Method Capabilities -- References -- 3. New Super Resolving Techniques and Methods for Microelectronics -- 3.1. The Basics of Super Resolution -- 3.2. Super-Resolution Imaging for Improved Failure Analysis -- 3.3. Usage of Radon Transform for Improved Failure Analysis
N2  - New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can't keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise
UR  - http://148.231.10.114:2048/login?url=http://www.sciencedirect.com/science/book/9780323241434
ER  -