TY  - BOOK
AU  - Murphy,Finbarr
AU  - McAlea,Eamonn M.
AU  - Mullins,Martin
ED  - SpringerLink (Online service)
TI  - Managing Risk in Nanotechnology: Topics in Governance, Assurance and Transfer 
T2  - Innovation, Technology, and Knowledge Management,
SN  - 9783319323923
AV  - HD28-70 
U1  - 658.514 23
PY  - 2016///
CY  - Cham
PB  - Springer International Publishing, Imprint: Springer
KW  - Business
KW  - Management
KW  - Industrial management
KW  - Quality control
KW  - Reliability
KW  - Industrial safety
KW  - Economic policy
KW  - Nanotechnology
KW  - Business and Management
KW  - Innovation/Technology Management
KW  - R & D/Technology Policy
KW  - Quality Control, Reliability, Safety and Risk
N1  - Ch 1 Nanomaterials and Nanotechnology Firms: A Typology -- Ch 2 A Bayesian Regression Methodology for Correlating Noisy Hazard and Structural Alert Parameters of Nano-materials -- Ch 3 Integrating the Social Impacts into Risk Governance of Nanotechnology -- Ch 4 International Cooperation on Nanosafety between Europe and Latin America -- Ch 5 The Inclusion of Data on Nanomaterials Transformations and Environmental Interactions into Existing Regulatory Frameworks -- Ch 6 INSCX exchange: the HUB approach to self-regulation in support of Risk Governance, Assurance and Transfer -- Ch 7 Applying "Safety by Molecular Design" Concepts to Nanomaterials Risk Management -- Ch 8 Is it too early to call for a moratorium on nanotechnology? -- Ch 9 "Nanotort" Liability at Common Law
N2  - This book aims to address how nanotechnology risks are being addressed by scientists, particularly in the areas of human health and the environment and how these risks can be measured in financial terms for insurers and regulators. It provides a comprehensive overview of nanotechnology risk measurement and risk transfer methods, including a chapter outlining how Bayesian methods can be used. It also examines nanotechnology from a legal perspective, both current and potential future outcomes. The global market for nanotechnology products was valued at
UR  - http://148.231.10.114:2048/login?url=http://dx.doi.org/10.1007/978-3-319-32392-3
ER  -