TY  - BOOK
AU  - Hübner,Michael
AU  - Silvano,Cristina
ED  - SpringerLink (Online service)
TI  - Near Threshold Computing: Technology, Methods and Applications 
SN  - 9783319233895
AV  - TK7888.4 
U1  - 621.3815 23
PY  - 2016///
CY  - Cham
PB  - Springer International Publishing, Imprint: Springer
KW  - Engineering
KW  - Microprocessors
KW  - Electronic circuits
KW  - Circuits and Systems
KW  - Processor Architectures
KW  - Electronic Circuits and Devices
N1  - PART I: NTC opportunities, challenges and limits -- Chapter 1: Extreme Energy Efficiency by Near Threshold Voltage Operation -- Part II Micro-architecture challenges and energy management at NTC -- Chapter2: Many-core Architecture for NTC: Energy Efficiency from the Ground Up -- Chapter 3: Variability-Aware Voltage Island Management for Near-Threshold Voltage Computing With Performance Guarantees -- Part III Memory system design for NTC -- Chapter4: Resizable Data Composer (RDC) Cache: A Near-Threshold Cache tolerating Process Variation Via architectural fault tolerance -- Chapter 5 Memories for NTC
N2  - This book explores near-threshold computing (NTC), a design-space using techniques to run digital chips (processors) near the lowest possible voltage. Readers will be enabled with specific techniques to design chips that are extremely robust; tolerating variability and resilient against errors. Variability-aware voltage and frequency allocation schemes will be presented that will provide performance guarantees, when moving toward near-threshold manycore chips. · Provides an introduction to near-threshold computing, enabling reader with a variety of tools to face the challenges of the power/utilization wall; · Demonstrates how to design efficient voltage regulation, so that each region of the chip can operate at the most efficient voltage and frequency point; · Investigates how performance guarantees can be ensured when moving towards NTC manycores through variability-aware voltage and frequency allocation schemes
UR  - http://148.231.10.114:2048/login?url=http://dx.doi.org/10.1007/978-3-319-23389-5
ER  -