TY  - BOOK
AU  - Raji,Mohsen
AU  - Ghavami,Behnam
ED  - SpringerLink (Online service)
TI  - Lifetime Reliability-aware Design of Integrated Circuits
SN  - 9783031153457
AV  - TK7867-7867.5 
U1  - 621.3815 23
PY  - 2023///
CY  - Cham
PB  - Springer International Publishing, Imprint: Springer
KW  - Electronic circuits
KW  - Embedded computer systems
KW  - Electronic circuit design
KW  - Electronic Circuits and Systems
KW  - Embedded Systems
KW  - Electronics Design and Verification
N1  - Acceso multiusuario; 1. Impacts of Process Variations and Aging on Lifetime Reliability of Flip-Flops -- 2 Restructuring-based Lifetime Reliability Improvement of Nano-scale Master-Slave Flip-Flops -- 3 Lifetime Reliability Improvement of Pulsed Flip-Flops -- 4 Gate Sizing-based Lifetime Reliability Improvement of Integrated Circuits -- 5 Joint Timing Yield and Lifetime Reliability Optimization of Integrated Circuits -- 6 Lifetime Reliability Optimization Algorithms of Integrated Circuits using Dual Threshold Voltage Assignment
N2  - This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits. Provides an easy-to-follow procedure for analyzing lifetime reliability of nano-scale digital circuits; Describes state-of-the art aging- and process variation-aware CAD algorithms; Includes reliability improvement techniques for common clocked storage element
UR  - http://libcon.rec.uabc.mx:2048/login?url=https://doi.org/10.1007/978-3-031-15345-7
ER  -