TY  - BOOK
AU  - Ramkaj,Athanasios T.
AU  - Pelgrom,Marcel J.M.
AU  - Steyaert,Michiel S.J.
AU  - Tavernier,Filip
ED  - SpringerLink (Online service)
TI  - Multi-Gigahertz Nyquist Analog-to-Digital Converters: Architecture and Circuit Innovations in Deep-Scaled CMOS and FinFET Technologies 
T2  - Analog Circuits and Signal Processing,
SN  - 9783031227097
AV  - TK7867-7867.5 
U1  - 621.3815 23
PY  - 2023///
CY  - Cham
PB  - Springer International Publishing, Imprint: Springer
KW  - Electronic circuits
KW  - Telecommunication
KW  - Embedded computer systems
KW  - Electronic Circuits and Systems
KW  - Microwaves, RF Engineering and Optical Communications
KW  - Embedded Systems
N1  - Acceso multiusuario; Introduction -- Analog-to-Digital Conversion Fundamentals -- Architectural Considerations for High-Efficiency GHz-Range ADCs -- Ultrahigh-Speed High-Sensitivity Dynamic Comparator -- High-Speed Wide-Bandwidth Single-Channel SAR ADC -- High-Resolution Wide-Bandwidth Time-Interleaved RF ADC -- Ultra-Wideband Direct RF Receiver Analog Front End -- Conclusions, Contributions, and Future Work.
N2  - This book proposes innovative circuit, architecture, and system solutions in deep-scaled CMOS and FinFET technologies, which address the challenges in maximizing the accuracy*speed/power of multi-GHz sample rate and bandwidth Analog-to-Digital Converters (ADC)s. A new holistic approach is introduced that first identifies the major error sources of a converter' building blocks, and quantitatively analyzes their impact on the overall performance, establishing the fundamental circuit-imposed accuracy - speed - power limits. The analysis extends to the architecture level, by introducing a mathematical framework to estimate and compare the accuracy - speed - power limits of several ADC architectures and variants. To gain system-level insight, time-interleaving is covered in detail, and a framework is also introduced to compare key metrics of interleaver architectures quantitatively. The impact of technology is also considered by adding process effects from several deep-scaled CMOS technologies. The validity of the introduced analytical approach and the feasibility of the proposed concepts are demonstrated by four silicon prototype Integrated Circuits (IC)s, realized in ultra-deep-scaled CMOS and FinFET technologies. Introduces a new, holistic approach for the analysis and design of high-performance ADCs in deep-scaled CMOS technologies, from theoretical concepts to silicon bring-up and verification; Describes novel methods and techniques to push the accuracy - speed - power boundaries of multi-GHz ADCs, analyzing core and peripheral circuits' trade-offs across the entire ADC chain; Supports the introduced analysis and design concepts by four state-of-the-art silicon prototype ICs, implemented in 28nm bulk CMOS and 16nm FinFET technologies; Provides a useful reference and a valuable tool for beginners as well as experienced ADC design engineers
UR  - http://libcon.rec.uabc.mx:2048/login?url=https://doi.org/10.1007/978-3-031-22709-7
ER  -