TY  - BOOK
AU  - Jain,Raj
AU  - Travieso,Carlos M.
AU  - Kumar,Sanjeev
ED  - SpringerLink (Online service)
TI  - Cybersecurity and Evolutionary Data Engineering: Select Proceedings of the 2nd International Conference, ICCEDE 2022 
T2  - Lecture Notes in Electrical Engineering,
SN  - 9789819950805
AV  - QA76.9.A25 
U1  - 005.8 23
PY  - 2023///
CY  - Singapore
PB  - Springer Nature Singapore, Imprint: Springer
KW  - Data protection
KW  - Engineering
KW  - Data processing
KW  - Cooperating objects (Computer systems)
KW  - Data and Information Security
KW  - Data Engineering
KW  - Cyber-Physical Systems
N1  - Acceso multiusuario; Current Status of Challenges in Data Security: A Review -- Cyber Bullying: The growing menace in cyber space with its challenges and solutions -- Hybrid Feature Extraction for Analysis of Network System Security - IDS -- Stranger Trust Architecture: An advancement to Zero Trust Architecture -- Genetic algorithm optimized SVM for DoS Attack Detection in VANETs -- Digital and IoT forensic: Recent trends, methods and challenges -- Cloud Based Occlusion Aware Intrusion Detection System -- Comparative Analysis of Web Application based Encryption Methods -- Linking of Ontologies for Composition of Semantic Web Services using Knowledge Graph -- Fake image dataset generation of Sign Language using GAN -- Analysis of Multimodal Biometric System based on ECG Biometrics -- Performance Analysis of Nature Inspired Optimization based Watermarking Schemes
N2  - This book comprises the select proceedings of the 2nd International Conference on Cybersecurity and Evolutionary Data Engineering (ICCEDE 2022). The contents highlight cybersecurity and digital forensics, evolutionary data engineering, and data management for secure contemporary applications. It includes papers on data models, semantics, query language; AI-driven industrial automation, ERP, CRM data security; authentication and access control; cyberspace structure and models; and drone large data filtration, cleansing, and security, among others. This book is of immense interest to researchers in academia and industry working in the fields of electronics and data engineering
UR  - http://libcon.rec.uabc.mx:2048/login?url=https://doi.org/10.1007/978-981-99-5080-5
ER  -