TY - BOOK AU - Zamiri Azar,Kimia AU - Mardani Kamali,Hadi AU - Farahmandi,Farimah AU - Tehranipoor,Mark ED - SpringerLink (Online service) TI - Understanding Logic Locking SN - 9783031379895 AV - TK7867-7867.5 U1 - 621.3815 23 PY - 2024/// CY - Cham PB - Springer International Publishing, Imprint: Springer KW - Electronic circuit design KW - Embedded computer systems KW - Electronic circuits KW - Electronics Design and Verification KW - Embedded Systems KW - Electronic Circuits and Systems N1 - Basics of VLSI Design -- Basics of VLSI Testing and Debug -- IP Protection in VLSI Design: A Historical View -- Making a Case for Logic Locking -- Fundamentals of Logic Locking -- Infrastructure around Logic Locking -- Impact of Satisfiability Solvers on Logic Locking -- Post-Satisfiability Era: Countermeasures and Threats -- Design-for-Testability and its Impact on Logic Locking -- Emergence of Cutting-edge Technologies on Logic Locking -- Logic Locking in Future IC Supply Chain Environments -- Multilayer Approach to Logic Locking -- A Step-by-Step Guide for Protecting/Locking Your IP -- A Step-by-Step Guide for Security Evaluation of Protected/Locked IP N2 - This book demonstrates the breadth and depth of IP protection through logic locking, considering both attacker/adversary and defender/designer perspectives. The authors draw a semi-chronological picture of the evolution of logic locking during the last decade, gathering and describing all the DO's and DON'Ts in this approach. They describe simple-to-follow scenarios and guide readers to navigate/identify threat models and design/evaluation flow for further studies. Readers will gain a comprehensive understanding of all fundamentals of logic locking. Covers modern VLSI design, testability and debug, and hardware security threats at different levels of abstraction; Provides a comprehensive overview of logic locking techniques and their applications to hardware security; Covers logic locking from implementation to evaluation, different assumptions, models and abstraction layers UR - http://libcon.rec.uabc.mx:2048/login?url=https://doi.org/10.1007/978-3-031-37989-5 ER -