Ultra Low Noise CMOS Image Sensors [electronic resource] / by Assim Boukhayma.

Por: Boukhayma, Assim [author.]Colaborador(es): SpringerLink (Online service)Tipo de material: TextoTextoSeries Springer Theses, Recognizing Outstanding Ph.D. ResearchEditor: Cham : Springer International Publishing : Imprint: Springer, 2018Edición: 1st ed. 2018Descripción: XIV, 180 p. 110 illus., 69 illus. in color. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9783319687742Tema(s): Electronics | Microelectronics | Signal processing | Image processing | Speech processing systems | Electronic circuits | Electronics and Microelectronics, Instrumentation | Signal, Image and Speech Processing | Circuits and SystemsFormatos físicos adicionales: Printed edition:: Sin título; Printed edition:: Sin título; Printed edition:: Sin títuloClasificación CDD: 621.381 Clasificación LoC:TK7800-8360TK7874-7874.9Recursos en línea: Libro electrónicoTexto
Contenidos:
Introduction -- Low-Noise CMOS Image Sensors -- Noise Sources and Mechanisms in CIS -- Detailed Noise Analysis in Low-Noise CMOS Image Sensors -- Noise Reduction in CIS Readout Chains -- Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process -- Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process -- A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling -- Downscaling Effects Towards Photon Counting Capability in CIS -- An Ultra Low Noise CMOS THz Imager -- Conclusion.
En: Springer Nature eBookResumen: This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied. Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors.
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Acceso multiusuario

Introduction -- Low-Noise CMOS Image Sensors -- Noise Sources and Mechanisms in CIS -- Detailed Noise Analysis in Low-Noise CMOS Image Sensors -- Noise Reduction in CIS Readout Chains -- Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process -- Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process -- A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling -- Downscaling Effects Towards Photon Counting Capability in CIS -- An Ultra Low Noise CMOS THz Imager -- Conclusion.

This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied. Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors.

UABC ; Temporal ; 01/01/2021-12/31/2023.

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