EM Material Characterization Techniques for Metamaterials [electronic resource] / by Raveendranath U. Nair, Maumita Dutta, Mohammed Yazeen P.S., K. S. Venu.
Tipo de material:
TextoSeries SpringerBriefs in Computational ElectromagneticsEditor: Singapore : Springer Singapore : Imprint: Springer, 2018Edición: 1st ed. 2018Descripción: XXIII, 50 p. 18 illus., 12 illus. in color. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9789811065170Tema(s): Microwaves | Optical engineering | Optical materials | Electronic materials | Electrical engineering | Microwaves, RF and Optical Engineering | Optical and Electronic Materials | Communications Engineering, NetworksFormatos físicos adicionales: Printed edition:: Sin título; Printed edition:: Sin títuloClasificación CDD: 621.3 Clasificación LoC:TK7876-7876.42Recursos en línea: Libro electrónico
En: Springer Nature eBookResumen: This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials .
| Tipo de ítem | Biblioteca actual | Colección | Signatura | Copia número | Estado | Fecha de vencimiento | Código de barras |
|---|---|---|---|---|---|---|---|
| Libro Electrónico | Biblioteca Electrónica | Colección de Libros Electrónicos | 1 | No para préstamo |
Acceso multiusuario
This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials .
UABC ; Temporal ; 01/01/2021-12/31/2023.
