Enhanced Virtual Prototyping for Heterogeneous Systems [electronic resource] / by Muhammad Hassan, Daniel Große, Rolf Drechsler.
Tipo de material: TextoEditor: Cham : Springer International Publishing : Imprint: Springer, 2023Edición: 1st ed. 2023Descripción: XX, 166 p. 63 illus., 59 illus. in color. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9783031055744Tema(s): Electronic circuits | Embedded computer systems | Electronic circuit design | Electronic Circuits and Systems | Embedded Systems | Electronics Design and VerificationFormatos físicos adicionales: Printed edition:: Sin título; Printed edition:: Sin título; Printed edition:: Sin títuloClasificación CDD: 621.3815 Clasificación LoC:TK7867-7867.5Recursos en línea: Libro electrónicoTipo de ítem | Biblioteca actual | Colección | Signatura | Copia número | Estado | Fecha de vencimiento | Código de barras |
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Libro Electrónico | Biblioteca Electrónica | Colección de Libros Electrónicos | 1 | No para préstamo |
Acceso multiusuario
Introduction -- Preliminaries -- AMS Metamorphic Testing Environment -- AMS Enhanced Code Coverage Verification Environment -- AMS Enhanced Functional Coverage Verification Environment -- Digital Early Security Validation -- Conclusion.
This book describes a comprehensive combination of methodologies that strongly enhance the modern Virtual Prototype (VP)-based verification flow for heterogeneous systems-on-chip (SOCs). In particular, the book combines verification and analysis aspects across various stages of the VP-based verification flow, providing a new perspective on verification by leveraging advanced techniques, like metamorphic testing, data flow testing, and information flow testing. In addition, the book puts a strong emphasis on advanced coverage-driven methodologies to verify the functional behavior of the SOC as well as ensure its security. Provides an extensive introduction to the modern VP-based verification flow for heterogeneous SOCs; Introduces a novel metamorphic testing technique for heterogeneous SOCs which does not require reference models; Includes automated advanced data flow coverage-driven methodologies tailored for SystemC/AMS-based VPs; Describes enhanced functional coverage-driven methodologies to verify various functional behaviors of RF amplifiers.
UABC ; Perpetuidad