Robust Computing with Nano-scale Devices [recurso electrónico] : Progresses and Challenges / edited by Chao Huang.

Por: Huang, Chao [editor.]Colaborador(es): SpringerLink (Online service)Tipo de material: Texto

TextoSeries Lecture Notes in Electrical Engineering ; 58Editor: Dordrecht : Springer Netherlands : Imprint: Springer, 2010Descripción: VIII, 200p. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9789048185405Tema(s): Engineering | Computer science | Electronic data processing | Systems engineering | Nanotechnology | Engineering | Circuits and Systems | Nanotechnology | Processor Architectures | Computing MethodologiesFormatos físicos adicionales: Printed edition:: Sin títuloClasificación CDD: 621.3815 Clasificación LoC:TK7888.4Recursos en línea: Libro electrónico Texto

Contenidos:

Fault Tolerant Nanocomputing -- Transistor-Level Based Defect-Tolerance for Reliable Nanoelectronics -- Fault-Tolerant Design for Nanowire-Based Programmable Logic Arrays -- Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics -- The Prospect and Challenges of CNFET Based Circuits: A Physical Insight -- Computing with Nanowires: A Self Assembled Neuromorphic Architecture -- Computational Opportunities and CAD for Nanotechnologies.

En: Springer eBooksResumen: Although complementary metal-oxide semiconductor (CMOS) technology will continue dominating the digital electronic circuits for the next 10-15 years, a number of grand challenges have emerged as the transistor size scales down. The rising costs of semiconductor mask and fabrication pose economic barriers to lithography. The quantum effects and increasing leakage power begin setting physical limits on continuous CMOS feature size shrinking. The research advances of innovative nano-scale devices have created great opportunities to surpass the barriers faced by CMOS technology, which include nanowires, carbon nanotube transistors, programmable molecular switches, resonant tunneling diodes, quantum dots, etc. However, the success of many nanotechnologies relies on the self-assembly fabrication process to fabricate circuits. The stochastic self-assembly fabrication, unfortunately, has low reliability with defect densities several orders of magnitude higher than conventional CMOS technology. Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.

Existencias ( 1 )
Notas de título ( 3 )

Existencias
Tipo de ítem	Biblioteca actual	Colección	Signatura	Copia número	Estado	Fecha de vencimiento	Código de barras
Libro Electrónico	Biblioteca Electrónica	Colección de Libros Electrónicos	TK7888.4 (Browse shelf(Abre debajo))	1	No para préstamo		377764-2001

Although complementary metal-oxide semiconductor (CMOS) technology will continue dominating the digital electronic circuits for the next 10-15 years, a number of grand challenges have emerged as the transistor size scales down. The rising costs of semiconductor mask and fabrication pose economic barriers to lithography. The quantum effects and increasing leakage power begin setting physical limits on continuous CMOS feature size shrinking. The research advances of innovative nano-scale devices have created great opportunities to surpass the barriers faced by CMOS technology, which include nanowires, carbon nanotube transistors, programmable molecular switches, resonant tunneling diodes, quantum dots, etc. However, the success of many nanotechnologies relies on the self-assembly fabrication process to fabricate circuits. The stochastic self-assembly fabrication, unfortunately, has low reliability with defect densities several orders of magnitude higher than conventional CMOS technology. Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.