LabVIEW based Automation Guide for Microwave Measurements [electronic resource] / by Satya Kesh Dubey, Naina Narang, P. S. Negi, V. N. Ojha.
Tipo de material: TextoSeries SpringerBriefs in Computational ElectromagneticsEditor: Singapore : Springer Singapore : Imprint: Springer, 2018Edición: 1st ed. 2018Descripción: XIV, 45 p. 31 illus. in color. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9789811062803Tema(s): Microwaves | Optical engineering | Physics | Electrical engineering | Microwaves, RF and Optical Engineering | Numerical and Computational Physics, Simulation | Communications Engineering, NetworksFormatos físicos adicionales: Printed edition:: Sin título; Printed edition:: Sin títuloClasificación CDD: 621.3 Clasificación LoC:TK7876-7876.42Recursos en línea: Libro electrónico En: Springer Nature eBookResumen: The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC). .Tipo de ítem | Biblioteca actual | Colección | Signatura | Copia número | Estado | Fecha de vencimiento | Código de barras |
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Libro Electrónico | Biblioteca Electrónica | Colección de Libros Electrónicos | 1 | No para préstamo |
Acceso multiusuario
The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC). .
UABC ; Temporal ; 01/01/2021-12/31/2023.