Reliability of Nanoscale Circuits and Systems [recurso electrónico] : Methodologies and Circuit Architectures / by Miloš Stanisavljevic, Alexandre Schmid, Yusuf Leblebici.

Por: Stanisavljevic, Miloš [author.]Colaborador(es): Schmid, Alexandre [author.] | Leblebici, Yusuf [author.] | SpringerLink (Online service)Tipo de material: TextoTextoEditor: New York, NY : Springer New York, 2011Descripción: XXVII, 195 p. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9781441962171Tema(s): Engineering | Computer aided design | System safety | Systems engineering | Engineering | Circuits and Systems | Quality Control, Reliability, Safety and Risk | Computer-Aided Engineering (CAD, CAE) and DesignFormatos físicos adicionales: Printed edition:: Sin títuloClasificación CDD: 621.3815 Clasificación LoC:TK7888.4Recursos en línea: Libro electrónicoTexto
Contenidos:
Introduction -- Reliability, Faults and Fault Models -- Nanotechnology and Nanodevices -- Fault-Tolerant Architectures and Approaches -- Reliability Evaluation Techniques -- Averaging Design Implementations -- Statistical Evaluation of Fault-Tolerance Using Proability Density Functions -- System Level Reliability Evaluation and Optimization -- Summary and Conclusions -- References.
En: Springer eBooksResumen: Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a major threat to the design of future integrated computing systems. Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures confronts that challenge. The first part discusses the state-of-the-art of the circuits and systems as well as the architectures and methodologies focusing the enhancement of the reliability of digital integrated circuits. It proposes circuit and system level solutions to overcome high defect density and presents reliability, fault models and fault tolerance. It includes an overview of nano-technologies that are considered in the fabrication of future integrated circuits and covers solutions provided in the early ages of CMOs as well as recent techniques. The second part of the text analyzes original circuit and system level solutions. It details an architecture suitable for circuit-level and gate-level redundant modules implementation and exhibiting significant immunity to permanent and random failures as well as unwanted fluctuation and the fabrication parameters. It also proposes a novel general method enabling the introduction of fault-tolerance and evaluation of the circuit and architecture reliability. And the third part proposes a new methodology that introduces reliability in existing design flows. That methodology consists of partitioning the full system to design into reliability optimal partitions and applying reliability evaluation and optimization at local and system level.
Star ratings
    Valoración media: 0.0 (0 votos)
Existencias
Tipo de ítem Biblioteca actual Colección Signatura Copia número Estado Fecha de vencimiento Código de barras
Libro Electrónico Biblioteca Electrónica
Colección de Libros Electrónicos TK7888.4 (Browse shelf(Abre debajo)) 1 No para préstamo 371597-2001

Introduction -- Reliability, Faults and Fault Models -- Nanotechnology and Nanodevices -- Fault-Tolerant Architectures and Approaches -- Reliability Evaluation Techniques -- Averaging Design Implementations -- Statistical Evaluation of Fault-Tolerance Using Proability Density Functions -- System Level Reliability Evaluation and Optimization -- Summary and Conclusions -- References.

Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a major threat to the design of future integrated computing systems. Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures confronts that challenge. The first part discusses the state-of-the-art of the circuits and systems as well as the architectures and methodologies focusing the enhancement of the reliability of digital integrated circuits. It proposes circuit and system level solutions to overcome high defect density and presents reliability, fault models and fault tolerance. It includes an overview of nano-technologies that are considered in the fabrication of future integrated circuits and covers solutions provided in the early ages of CMOs as well as recent techniques. The second part of the text analyzes original circuit and system level solutions. It details an architecture suitable for circuit-level and gate-level redundant modules implementation and exhibiting significant immunity to permanent and random failures as well as unwanted fluctuation and the fabrication parameters. It also proposes a novel general method enabling the introduction of fault-tolerance and evaluation of the circuit and architecture reliability. And the third part proposes a new methodology that introduces reliability in existing design flows. That methodology consists of partitioning the full system to design into reliability optimal partitions and applying reliability evaluation and optimization at local and system level.

19

Con tecnología Koha