000 02868nam a22004575i 4500
001 u370190
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005 20160812080019.0
007 cr nn 008mamaa
008 100301s2010 xxu| s |||| 0|eng d
020 _a9780387471013
_9978-0-387-47101-3
040 _cMX-MeUAM
050 4 _aTK7888.4
082 0 4 _a621.3815
_223
100 1 _aJespers, Paul.
_eauthor.
245 1 4 _aThe gm/ID Methodology, A Sizing Tool for Low-voltage Analog CMOS Circuits
_h[recurso electrónico] :
_bThe semi-empirical and compact model approaches /
_cby Paul Jespers.
264 1 _aBoston, MA :
_bSpringer US,
_c2010.
300 _aXVI, 171p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aAnalog Circuits and Signal Processing
520 _aHow to determine transistor sizes and currents when the supply voltages of analog CMOS circuits do not exceed 1.2V and transistors operate in weak, moderate or strong inversion? The gm/ID methodology offers a solution provided a reference transconductance over drain current ratio is available. The reference may be the result of measurements carried out on real physical transistors or advanced models. The reference may also take advantage of a compact model. In The gm/ID Methodology, a Sizing Tool for Low-Voltage Analog CMOS Circuits, we compare the semi-empirical to the compact model approach. Small numbers of parameters make the compact model attractive for the model paves the way towards analytic expressions unaffordable otherwise. The E.K.V model is a good candidate, but when it comes to short channel devices, compact models are either inaccurate or loose straightforwardness. Because sizing requires basically a reliable large signal representation of MOS transistors, we investigate the potential of the E.K.V model when its parameters are supposed to be bias dependent. The model-driven and semi-empirical methods are compared considering the Intrinsic Gain Stage and a few more complex circuits. A series of MATLAB files found on extras-springer.com allow redoing the tests.
650 0 _aEngineering.
650 0 _aComputer science.
650 0 _aSystems engineering.
650 1 4 _aEngineering.
650 2 4 _aCircuits and Systems.
650 2 4 _aProcessor Architectures.
650 2 4 _aSolid State Physics.
650 2 4 _aSpectroscopy and Microscopy.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9780387471006
830 0 _aAnalog Circuits and Signal Processing
856 4 0 _zLibro electrónico
_uhttp://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-0-387-47101-3
596 _a19
942 _cLIBRO_ELEC
999 _c198070
_d198070