000			03927nam a22005055i 4500
001			u370385
003			SIRSI
005			20160812080030.0
007			cr nn 008mamaa
008			100715s2010 xxu| s |||| 0|eng d
020			_a9780387981826 _9978-0-387-98182-6
040			_cMX-MeUAM
050		4	_aTA404.6
082	0	4	_a620.11 _223
100	1		_aAyache, Jeanne. _eauthor.
245	1	0	_aSample Preparation Handbook for Transmission Electron Microscopy _h[recurso electrónico] : _bMethodology / _cby Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub.
264		1	_aNew York, NY : _bSpringer New York : _bImprint: Springer, _c2010.
300			_aXXIII, 250 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
505	0		_aMethodology: General Introduction -- to Materials -- The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM) -- Materials Problems and Approaches for TEM and TEM/STEM Analyses -- Physical and Chemical Mechanisms of Preparation Techniques -- Artifacts in Transmission Electron Microscopy -- Selection of Preparation Techniques Based on Material Problems and TEM Analyses -- Comparisons of Techniques -- Conclusion: What Is a Good Sample?.
520			_aThis two-volume Handbook is a comprehensive and authoritative guide to sample preparation for the transmission electron microscope. This first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology. Key Features of the Handbook: Combines all of the latest techniques for the preparation of mineral to biological samples Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level) Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis Links to a complementary interactive database website which is available to scientists worldwide* Written by authors with 100 years of combined experience in electron microscopy http://temsamprep.in2p3.fr/
650		0	_aMineralogy.
650		0	_aMicroscopy.
650		0	_aNanotechnology.
650		0	_aSurfaces (Physics).
650	1	4	_aMaterials Science.
650	2	4	_aCharacterization and Evaluation of Materials.
650	2	4	_aBiological Microscopy.
650	2	4	_aMineralogy.
650	2	4	_aNanotechnology.
700	1		_aBeaunier, Luc. _eauthor.
700	1		_aBoumendil, Jacqueline. _eauthor.
700	1		_aEhret, Gabrielle. _eauthor.
700	1		_aLaub, Danièle. _eauthor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9780387981819
856	4	0	_zLibro electrónico _uhttp://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-0-387-98182-6
596			_a19
942			_cLIBRO_ELEC
999			_c198265 _d198265