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007 cr nn 008mamaa
008 100708s2010 xxu| s |||| 0|eng d
020 _a9780817649241
_9978-0-8176-4924-1
040 _cMX-MeUAM
050 4 _aQA276-280
082 0 4 _a519.5
_223
100 1 _aNikulin, M.S.
_eeditor.
245 1 0 _aAdvances in Degradation Modeling
_h[recurso electrónico] :
_bApplications to Reliability, Survival Analysis, and Finance /
_cedited by M.S. Nikulin, Nikolaos Limnios, N. Balakrishnan, Waltraud Kahle, Catherine Huber-Carol.
264 1 _aBoston, MA :
_bBirkhäuser Boston,
_c2010.
300 _aXXXVIII, 416p. 98 illus.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aStatistics for Industry and Technology
505 0 _aReview, Tutorials, and Perspective -- Trends in the Statistical Assessment of Reliability -- Degradation Processes: An Overview -- Defect Initiation, Growth, and Failure – A General Statistical Model and Data Analyses -- Properties of Lifetime Estimators Based on Warranty Data Consisting only of Failures -- Shock Models -- Shock Models -- Parametric Shock Models -- Poisson Approximation of Processes with Locally Independent Increments and Semi-Markov Switching – Toward Application in Reliability -- On Some Shock Models of Degradation -- Degradation Models -- The Wiener Process as a Degradation Model: Modeling and Parameter Estimation -- On the General Degradation Path Model: Review and Simulation -- A Closer Look at Degradation Models: Classical and Bayesian Approaches -- Optimal Prophylaxis Policy Under Non-monotone Degradation -- Deterioration Processes With Increasing Thresholds -- Failure Time Models Based on Degradation Processes -- Degradation and Fuzzy Information -- A New Perspective on Damage Accumulation, Marker Processes, and Weibull’s Distribution -- Reliability Estimation and ALT -- Reliability Estimation of Mechanical Components Using Accelerated Life Testing Models -- Reliability Estimation from Failure-Degradation Data with Covariates -- Asymptotic Properties of Redundant Systems Reliability Estimators -- An Approach to System Reliability Demonstration Based on Accelerated Test Results on Components -- Survival Function Estimation -- Robust Versus Nonparametric Approaches and Survival Data Analysis -- Modelling Recurrent Events for Repairable Systems Under Worse Than Old Assumption -- Survival Models for Step-Stress Experiments With Lagged Effects -- Estimation of Density on Censored Data -- Competing Risk and Chaotic Systems -- Toward a Test for Departure of a Trajectory from a Neighborhood of a Chaotic System -- Probability Plotting with Independent Competing Risks.
520 _aThis volume—dedicated to William Q. Meeker on the occasion of his sixtieth birthday—is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. The book covers a wide range of applications to areas such as reliability, quality control, the health sciences, economics, and finance. Specific topics covered include: * Accelerated testing and inference * Step-stress testing and inference * Nonparametric inference * Model validity in accelerated testing * The point process approach * Bootstrap methods in degradation analysis * Exact inferential methods in reliability * Dynamic perturbed systems * Degradation models in statistics Advances in Degradation Modeling is an excellent reference for researchers and practitioners in applied probability and statistics, industrial statistics, the health sciences, quality control, economics, and finance.
650 0 _aStatistics.
650 0 _aMathematical statistics.
650 0 _aEconomics
_xStatistics.
650 1 4 _aStatistics.
650 2 4 _aStatistical Theory and Methods.
650 2 4 _aStatistics for Life Sciences, Medicine, Health Sciences.
650 2 4 _aStatistics for Business/Economics/Mathematical Finance/Insurance.
700 1 _aLimnios, Nikolaos.
_eeditor.
700 1 _aBalakrishnan, N.
_eeditor.
700 1 _aKahle, Waltraud.
_eeditor.
700 1 _aHuber-Carol, Catherine.
_eeditor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9780817649234
830 0 _aStatistics for Industry and Technology
856 4 0 _zLibro electrónico
_uhttp://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-0-8176-4924-1
596 _a19
942 _cLIBRO_ELEC
999 _c198301
_d198301