000 04384nam a22003975i 4500
001 u371843
003 SIRSI
005 20160812080151.0
007 cr nn 008mamaa
008 101212s2011 xxu| s |||| 0|eng d
020 _a9781441971678
_9978-1-4419-7167-8
040 _cMX-MeUAM
050 4 _aTA404.6
082 0 4 _a620.11
_223
100 1 _aKalinin, Sergei V.
_eeditor.
245 1 0 _aScanning Probe Microscopy of Functional Materials
_h[recurso electrónico] :
_bNanoscale Imaging and Spectroscopy /
_cedited by Sergei V. Kalinin, Alexei Gruverman.
264 1 _aNew York, NY :
_bSpringer New York,
_c2011.
300 _aXVIII, 555 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aI. Emergent phenomena in strongly-correlated systems: Phase separation and novel quaziparticles in nanowires -- STM of ruthenates and manganites -- STM of superconductors -- STM of cuprates -- II. Semiconductor and photovoltaic materials: SPM of solar materials -- Cross-sectional STM of semiconductor heterostructures -- Charge dynamics in photovoltaic polymers -- III. Functional probing of biosystems and macromolecules: Molecular Imaging of biomembranes single molecules with electrically functionalized probes -- AFM/patch clamp in biology -- Electrical imaging of membranes -- Cell dynamics by Ion conductance microscopy -- Ferroelectric polymers -- IV. SPM of magnetic materials: Spin manipulation by STM -- Magnetic Resonant Force Microscopy -- Magnetic Force Microscopy -- V. Electromechanics on the nanoscale: ferroelectrics and multiferroics: New dynamic modes and energy dissipation in SPM -- Polarization dynamics in relaxor ferroelectrics -- Piezoresponse Force Spectroscopy -- Polarization dynamics in capacitors and heterostructures -- VI. Mechanical properties: Nanomechanics by SPM -- Atomic Force Acoustic Microscopy of functional materials -- VII. Optical methods: NSOM and NSOM-transport -- NSOM -- Optical machines and unfolding -- Optically-assisted pump-probe STM -- VIII. Emerging SPM applications: STM/NC-AFM -- Scanning Non-linear Dielectric Microscopy -- Vibrational spectroscopy of single molecule -- Ultrafast ac STM -- SPM and electron microscopy combined -- In-situ STEM-nanoindentation -- Material characterization by SPM-focused X-ray combination -- *see Long ToC for tentative contributors.
520 _aNovel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging applications of spectroscopic imaging and multifrequency SPM methods, thermomechanical characterization, ion-conductance microscopy, as well as combined SPM-mass spectrometry, SPM-patch clamp, and SPM-focused X-ray applications. By bringing together critical reviews by leading researchers on the application of SPM to the nanoscale characterization of functional materials properties, Scanning Probe Microscopy of Functional Materials provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology. Key Features: •Serves the rapidly developing field of nanoscale characterization of functional materials properties •Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors •Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations •Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization
650 0 _aSurfaces (Physics).
650 1 4 _aMaterials Science.
650 2 4 _aCharacterization and Evaluation of Materials.
700 1 _aGruverman, Alexei.
_eeditor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781441965677
856 4 0 _zLibro electrónico
_uhttp://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-1-4419-7167-8
596 _a19
942 _cLIBRO_ELEC
999 _c199723
_d199723