000			03144nam a22005055i 4500
001			u371854
003			SIRSI
005			20160812080151.0
007			cr nn 008mamaa
008			110324s2011 xxu| s |||| 0|eng d
020			_a9781441972002 _9978-1-4419-7200-2
040			_cMX-MeUAM
050		4	_aTA1750-1750.22
082	0	4	_a620.11295 _223
082	0	4	_a620.11297 _223
100	1		_aPennycook, Stephen J. _eeditor.
245	1	0	_aScanning Transmission Electron Microscopy _h[recurso electrónico] : _bImaging and Analysis / _cedited by Stephen J. Pennycook, Peter D. Nellist.
264		1	_aNew York, NY : _bSpringer New York : _bImprint: Springer, _c2011.
300			_aXII, 762 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
505	0		_aElectron Optics and Aberration Correction -- Fundamentals of Scattering Theory -- Image formation in STEM -- Electron energy loss spectroscopy -- Energy dispersive x-ray analysis -- STEM of complex oxides -- STEM of complex alloys -- STEM of catalysts -- STEM of semiconductor devices -- STEM of ceramic materials -- STEM of quasicrystals -- STEM of nanomaterials -- 3D STEM: tomography -- 3D STEM: depth slicing -- Nanobeam diffraction.
520			_aScanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the editors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy: Imaging and Analysis provides a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the history of the field, the instrument, image formation and scattering theory, as well as practical aspects of imaging and analysis. The authors present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, and nanoscience. Therefore this is a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
650		0	_aMicroscopy.
650		0	_aOptical materials.
650		0	_aNanotechnology.
650		0	_aSurfaces (Physics).
650	1	4	_aMaterials Science.
650	2	4	_aOptical and Electronic Materials.
650	2	4	_aCharacterization and Evaluation of Materials.
650	2	4	_aBiological Microscopy.
650	2	4	_aSolid State Physics.
650	2	4	_aCondensed Matter Physics.
650	2	4	_aNanotechnology.
700	1		_aNellist, Peter D. _eeditor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781441971999
856	4	0	_zLibro electrónico _uhttp://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-1-4419-7200-2
596			_a19
942			_cLIBRO_ELEC
999			_c199734 _d199734