000			02899nam a22005415i 4500
001			u373440
003			SIRSI
005			20160812084146.0
007			cr nn 008mamaa
008			100907s2010 gw | s |||| 0|eng d
020			_a9783642024177 _9978-3-642-02417-7
040			_cMX-MeUAM
050		4	_aQC350-467
050		4	_aTA1501-1820
050		4	_aQC392-449.5
050		4	_aTA1750-1750.22
082	0	4	_a621.36 _223
100	1		_aBreitenstein, Otwin. _eauthor.
245	1	0	_aLock-in Thermography _h[recurso electrónico] : _bBasics and Use for Evaluating Electronic Devices and Materials / _cby Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp.
264		1	_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2010.
300			_aX, 258 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
490	1		_aSpringer Series in Advanced Microelectronics, _x1437-0387 ; _v10
505	0		_aIntroduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook.
520			_aThis book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.
650		0	_aPhysics.
650		0	_aEngineering.
650		0	_aMaterials.
650		0	_aSurfaces (Physics).
650	1	4	_aPhysics.
650	2	4	_aOptics, Optoelectronics, Plasmonics and Optical Devices.
650	2	4	_aCharacterization and Evaluation of Materials.
650	2	4	_aEngineering, general.
650	2	4	_aStructural Materials.
700	1		_aWarta, Wilhelm. _eauthor.
700	1		_aLangenkamp, Martin. _eauthor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9783642024160
830		0	_aSpringer Series in Advanced Microelectronics, _x1437-0387 ; _v10
856	4	0	_zLibro electrónico _uhttp://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-3-642-02417-7
596			_a19
942			_cLIBRO_ELEC
999			_c201320 _d201320