000 | 02899nam a22005415i 4500 | ||
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001 | u373440 | ||
003 | SIRSI | ||
005 | 20160812084146.0 | ||
007 | cr nn 008mamaa | ||
008 | 100907s2010 gw | s |||| 0|eng d | ||
020 |
_a9783642024177 _9978-3-642-02417-7 |
||
040 | _cMX-MeUAM | ||
050 | 4 | _aQC350-467 | |
050 | 4 | _aTA1501-1820 | |
050 | 4 | _aQC392-449.5 | |
050 | 4 | _aTA1750-1750.22 | |
082 | 0 | 4 |
_a621.36 _223 |
100 | 1 |
_aBreitenstein, Otwin. _eauthor. |
|
245 | 1 | 0 |
_aLock-in Thermography _h[recurso electrónico] : _bBasics and Use for Evaluating Electronic Devices and Materials / _cby Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp. |
264 | 1 |
_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2010. |
|
300 |
_aX, 258 p. _bonline resource. |
||
336 |
_atext _btxt _2rdacontent |
||
337 |
_acomputer _bc _2rdamedia |
||
338 |
_aonline resource _bcr _2rdacarrier |
||
347 |
_atext file _bPDF _2rda |
||
490 | 1 |
_aSpringer Series in Advanced Microelectronics, _x1437-0387 ; _v10 |
|
505 | 0 | _aIntroduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook. | |
520 | _aThis book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced. | ||
650 | 0 | _aPhysics. | |
650 | 0 | _aEngineering. | |
650 | 0 | _aMaterials. | |
650 | 0 | _aSurfaces (Physics). | |
650 | 1 | 4 | _aPhysics. |
650 | 2 | 4 | _aOptics, Optoelectronics, Plasmonics and Optical Devices. |
650 | 2 | 4 | _aCharacterization and Evaluation of Materials. |
650 | 2 | 4 | _aEngineering, general. |
650 | 2 | 4 | _aStructural Materials. |
700 | 1 |
_aWarta, Wilhelm. _eauthor. |
|
700 | 1 |
_aLangenkamp, Martin. _eauthor. |
|
710 | 2 | _aSpringerLink (Online service) | |
773 | 0 | _tSpringer eBooks | |
776 | 0 | 8 |
_iPrinted edition: _z9783642024160 |
830 | 0 |
_aSpringer Series in Advanced Microelectronics, _x1437-0387 ; _v10 |
|
856 | 4 | 0 |
_zLibro electrónico _uhttp://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-3-642-02417-7 |
596 | _a19 | ||
942 | _cLIBRO_ELEC | ||
999 |
_c201320 _d201320 |