000			04452nam a22004695i 4500
001			u373552
003			SIRSI
005			20160812084151.0
007			cr nn 008mamaa
008			100715s2010 gw | s |||| 0|eng d
020			_a9783642035357 _9978-3-642-03535-7
040			_cMX-MeUAM
050		4	_aT174.7
050		4	_aTA418.9.N35
082	0	4	_a620.115 _223
100	1		_aBhushan, Bharat. _eeditor.
245	1	0	_aScanning Probe Microscopy in Nanoscience and Nanotechnology _h[recurso electrónico] / _cedited by Bharat Bhushan.
264		1	_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2010.
300			_aXXX, 956p. 300 illus. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
490	1		_aNanoScience and Technology, _x1434-4904
505	0		_aScanning Probe Microscopy Techniques -- Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids -- Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy -- Polarization-Sensitive Tip-Enhanced Raman Scattering -- Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes -- Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics -- Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity -- Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter -- Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope -- Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy -- Characterization -- Simultaneous Topography and Recognition Imaging -- Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM -- Force-Extension and Force-Clamp AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical Properties of Single Biomolecules -- Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices -- Quantized Mechanics of Nanotubes and Bundles -- Spin and Charge Pairing Instabilities in Nanoclusters and Nanomaterials -- Mechanical Properties of One-Dimensional Nanostructures -- Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale -- Controlling Wear on Nanoscale -- Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping -- Industrial Applications -- Modern Atomic Force Microscopy and Its Application to the Study of Genome Architecture -- Near-Field Optical Litography -- A New AFM-Based Lithography Method: Thermochemical Nanolithography -- Scanning Probe Alloying Nanolithography -- Structuring the Surface of Crystallizable Polymers with an AFM Tip -- Application of Contact Mode AFM to Manufacturing Processes -- Scanning Probe Microscopy as a Tool Applied to Agriculture.
520			_aThis book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber
650		0	_aMaterials.
650		0	_aEngineering.
650		0	_aNanotechnology.
650	1	4	_aMaterial Science.
650	2	4	_aNanotechnology.
650	2	4	_aCondensed Matter Physics.
650	2	4	_aEngineering, general.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9783642035340
830		0	_aNanoScience and Technology, _x1434-4904
856	4	0	_zLibro electrónico _uhttp://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-3-642-03535-7
596			_a19
942			_cLIBRO_ELEC
999			_c201432 _d201432