000 | 02876nam a22004335i 4500 | ||
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001 | u374155 | ||
003 | SIRSI | ||
005 | 20160812084220.0 | ||
007 | cr nn 008mamaa | ||
008 | 110330s2011 gw | s |||| 0|eng d | ||
020 |
_a9783642120121 _9978-3-642-12012-1 |
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040 | _cMX-MeUAM | ||
050 | 4 | _aTA404.6 | |
082 | 0 | 4 |
_a620.11 _223 |
100 | 1 |
_aLeach, Richard. _eeditor. |
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245 | 1 | 0 |
_aOptical Measurement of Surface Topography _h[recurso electrónico] / _cedited by Richard Leach. |
264 | 1 |
_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2011. |
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300 |
_aXIII, 323 p. _bonline resource. |
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336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
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347 |
_atext file _bPDF _2rda |
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505 | 0 | _aIntroduction to surface texture measurement -- Some common terms and definitions -- Limitations of optical 3D sensors.- Calibration of optical surface topography measuring instruments.- Chromatic confocal microscopy -- Point autofocus instruments.- Focus variation instruments.- Phase shifting interferometry.- Coherence scanning interferometry -- Digital holographic microscopy.- Imaging confocal microscopy.- Light scattering methods. | |
520 | _aThe measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies. | ||
650 | 0 | _aMicrowaves. | |
650 | 0 | _aSurfaces (Physics). | |
650 | 1 | 4 | _aMaterials Science. |
650 | 2 | 4 | _aCharacterization and Evaluation of Materials. |
650 | 2 | 4 | _aMicrowaves, RF and Optical Engineering. |
650 | 2 | 4 | _aMeasurement Science and Instrumentation. |
650 | 2 | 4 | _aSurfaces and Interfaces, Thin Films. |
710 | 2 | _aSpringerLink (Online service) | |
773 | 0 | _tSpringer eBooks | |
776 | 0 | 8 |
_iPrinted edition: _z9783642120114 |
856 | 4 | 0 |
_zLibro electrónico _uhttp://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-3-642-12012-1 |
596 | _a19 | ||
942 | _cLIBRO_ELEC | ||
999 |
_c202035 _d202035 |