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001 u374155
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007 cr nn 008mamaa
008 110330s2011 gw | s |||| 0|eng d
020 _a9783642120121
_9978-3-642-12012-1
040 _cMX-MeUAM
050 4 _aTA404.6
082 0 4 _a620.11
_223
100 1 _aLeach, Richard.
_eeditor.
245 1 0 _aOptical Measurement of Surface Topography
_h[recurso electrónico] /
_cedited by Richard Leach.
264 1 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg,
_c2011.
300 _aXIII, 323 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aIntroduction to surface texture measurement -- Some common terms and definitions -- Limitations of optical 3D sensors.- Calibration of optical surface topography measuring instruments.- Chromatic confocal microscopy -- Point autofocus instruments.- Focus variation instruments.- Phase shifting interferometry.-  Coherence scanning interferometry -- Digital holographic microscopy.- Imaging confocal microscopy.- Light scattering methods.
520 _aThe measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manu­facturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
650 0 _aMicrowaves.
650 0 _aSurfaces (Physics).
650 1 4 _aMaterials Science.
650 2 4 _aCharacterization and Evaluation of Materials.
650 2 4 _aMicrowaves, RF and Optical Engineering.
650 2 4 _aMeasurement Science and Instrumentation.
650 2 4 _aSurfaces and Interfaces, Thin Films.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783642120114
856 4 0 _zLibro electrónico
_uhttp://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-3-642-12012-1
596 _a19
942 _cLIBRO_ELEC
999 _c202035
_d202035