000 | 03227nam a22004815i 4500 | ||
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001 | u375364 | ||
003 | SIRSI | ||
005 | 20160812084320.0 | ||
007 | cr nn 008mamaa | ||
008 | 110317s2011 gw | s |||| 0|eng d | ||
020 |
_a9783642166358 _9978-3-642-16635-8 |
||
040 | _cMX-MeUAM | ||
050 | 4 | _aTA404.6 | |
082 | 0 | 4 |
_a620.11 _223 |
100 | 1 |
_aWaseda, Yoshio. _eauthor. |
|
245 | 1 | 0 |
_aX-Ray Diffraction Crystallography _h[recurso electrónico] : _bIntroduction, Examples and Solved Problems / _cby Yoshio Waseda, Eiichiro Matsubara, Kozo Shinoda. |
264 | 1 |
_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2011. |
|
300 |
_aXI, 310 p. _bonline resource. |
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336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
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347 |
_atext file _bPDF _2rda |
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505 | 0 | _aFundamental Properties of X-rays -- Geometry of Crystals -- Scattering and Diffraction by Atoms and Crystals -- Diffraction from a Polycrystalline Sample and its Application to Determination of Crystal Structures -- Reciprocal Lattice and Integrated Intensity from Crystals -- Symmetry Analysis for Crystals and the Use of International Tables -- Solved Problems. | |
520 | _aX-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements. | ||
650 | 0 | _aCrystallography. | |
650 | 0 | _aEngineering. | |
650 | 0 | _aSurfaces (Physics). | |
650 | 1 | 4 | _aMaterials Science. |
650 | 2 | 4 | _aCharacterization and Evaluation of Materials. |
650 | 2 | 4 | _aCrystallography. |
650 | 2 | 4 | _aNanotechnology and Microengineering. |
650 | 2 | 4 | _aSolid State Physics. |
650 | 2 | 4 | _aSpectroscopy and Microscopy. |
700 | 1 |
_aMatsubara, Eiichiro. _eauthor. |
|
700 | 1 |
_aShinoda, Kozo. _eauthor. |
|
710 | 2 | _aSpringerLink (Online service) | |
773 | 0 | _tSpringer eBooks | |
776 | 0 | 8 |
_iPrinted edition: _z9783642166341 |
856 | 4 | 0 |
_zLibro electrónico _uhttp://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-3-642-16635-8 |
596 | _a19 | ||
942 | _cLIBRO_ELEC | ||
999 |
_c203244 _d203244 |