000 03227nam a22004815i 4500
001 u375364
003 SIRSI
005 20160812084320.0
007 cr nn 008mamaa
008 110317s2011 gw | s |||| 0|eng d
020 _a9783642166358
_9978-3-642-16635-8
040 _cMX-MeUAM
050 4 _aTA404.6
082 0 4 _a620.11
_223
100 1 _aWaseda, Yoshio.
_eauthor.
245 1 0 _aX-Ray Diffraction Crystallography
_h[recurso electrónico] :
_bIntroduction, Examples and Solved Problems /
_cby Yoshio Waseda, Eiichiro Matsubara, Kozo Shinoda.
264 1 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg,
_c2011.
300 _aXI, 310 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aFundamental Properties of X-rays -- Geometry of Crystals -- Scattering and Diffraction by Atoms and Crystals -- Diffraction from a Polycrystalline Sample and its Application to Determination of Crystal Structures -- Reciprocal Lattice and Integrated Intensity from Crystals -- Symmetry Analysis for Crystals and the Use of International Tables -- Solved Problems.
520 _aX-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
650 0 _aCrystallography.
650 0 _aEngineering.
650 0 _aSurfaces (Physics).
650 1 4 _aMaterials Science.
650 2 4 _aCharacterization and Evaluation of Materials.
650 2 4 _aCrystallography.
650 2 4 _aNanotechnology and Microengineering.
650 2 4 _aSolid State Physics.
650 2 4 _aSpectroscopy and Microscopy.
700 1 _aMatsubara, Eiichiro.
_eauthor.
700 1 _aShinoda, Kozo.
_eauthor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783642166341
856 4 0 _zLibro electrónico
_uhttp://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-3-642-16635-8
596 _a19
942 _cLIBRO_ELEC
999 _c203244
_d203244