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| 001 | u377572 | ||
| 003 | SIRSI | ||
| 005 | 20160812084509.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 100301s2010 ne | s |||| 0|eng d | ||
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_a9789048132829 _9978-90-481-3282-9 |
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| 050 | 4 | _aTK7888.4 | |
| 082 | 0 | 4 |
_a621.3815 _223 |
| 100 | 1 |
_aWunderlich, Hans-Joachim. _eeditor. |
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| 245 | 1 | 0 |
_aModels in Hardware Testing _h[recurso electrónico] : _bLecture Notes of the Forum in Honor of Christian Landrault / _cedited by Hans-Joachim Wunderlich. |
| 264 | 1 |
_aDordrecht : _bSpringer Netherlands, _c2010. |
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| 300 |
_aXIV, 257 p. _bonline resource. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
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| 338 |
_aonline resource _bcr _2rdacarrier |
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| 347 |
_atext file _bPDF _2rda |
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| 490 | 1 |
_aFrontiers in Electronic Testing, _x0929-1296 ; _v43 |
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| 520 | _aModel based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance. Models in Hardware Testing treats models and especially fault models in hardware testing in a comprehensive way not found anywhere else. Engineers who are responsible for product quality and test coverage, students who want to learn about quality assessment for new technologies or lecturers who are interested in the most recent advances in model based hardware testing will take benefits from reading. The material collected in Models in Hardware Testing was prepared for the forum in honor of Christian Landrault in connection with the European Test Symposium 2009. | ||
| 650 | 0 | _aEngineering. | |
| 650 | 0 | _aOperating systems (Computers). | |
| 650 | 0 | _aSystems engineering. | |
| 650 | 1 | 4 | _aEngineering. |
| 650 | 2 | 4 | _aCircuits and Systems. |
| 650 | 2 | 4 | _aPerformance and Reliability. |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 776 | 0 | 8 |
_iPrinted edition: _z9789048132812 |
| 830 | 0 |
_aFrontiers in Electronic Testing, _x0929-1296 ; _v43 |
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| 856 | 4 | 0 |
_zLibro electrónico _uhttp://148.231.10.114:2048/login?url=http://link.springer.com/book/10.1007/978-90-481-3282-9 |
| 596 | _a19 | ||
| 942 | _cLIBRO_ELEC | ||
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_c205452 _d205452 |
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