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005 | 20160812084627.0 | ||
006 | m o d | ||
007 | cr cnu---unuuu | ||
008 | 140315s2014 enk o 000 0 eng d | ||
040 |
_aEBLCP _beng _epn _cEBLCP _dOPELS _dIDEBK _dCDX _dOCLCF _dOCLCQ |
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019 | _a872644590 | ||
020 |
_a9780128008195 _q(electronic bk.) |
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020 |
_a0128008199 _q(electronic bk.) |
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020 |
_a1306490383 _q(ebk) |
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020 |
_a9781306490382 _q(ebk) |
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020 | _z9780128007471 | ||
029 | 1 |
_aAU@ _b000052839832 |
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029 | 1 |
_aDEBSZ _b414272927 |
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029 | 1 |
_aCHVBK _b327764686 |
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_aCHBIS _b010295253 |
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029 | 1 |
_aNLGGC _b389707724 |
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050 | 4 |
_aQA76.612 _b.R384 2014 |
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082 | 0 | 4 | _a005.11 |
049 | _aTEFA | ||
100 | 1 | _aBernstein, Joseph. | |
245 | 1 | 0 |
_aReliability prediction from burn-in data fit to reliability models _h[recurso electrónico] / _cJoseph B. Bernstein. |
260 |
_aLondon : _bAcademic Press, _c2014. |
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300 | _a1 online resource (108 pages) | ||
336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
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588 | 0 | _aPrint version record. | |
505 | 0 | _aFront Cover; Reliability Prediction from Burn-In Data Fit to Reliability Models; Copyright Page; Contents; Introduction; 1 Shortcut to Accurate Reliability Prediction; 1.1 Background of FIT; 1.2 Multiple Failure Mechanism Model; 1.3 Acceleration Factor; 1.4 New Proportionality Method; 1.5 Chip Designer; 1.6 System Designer; 2 M-HTOL Principles; 2.1 Constant Rate Assumption; 2.2 Reliability Criteria; 2.3 The Failure Rate Curve for Electronic Systems; 2.4 Reliability Testing; 2.5 Accelerated Testing; 3 Failure Mechanisms; 3.1 Time-Dependent Dielectric Breakdown. | |
505 | 8 | _a3.1.1 Early Models for Dielectric Breakdown3.1.2 Acceleration Factors; 3.1.3 Models for Ultrathin Dielectric Breakdown; 3.1.4 Statistical Model; 3.2 Hot Carrier Injection; 3.2.1 Hot Carrier Effects; 3.2.2 Acceleration Factor; 3.2.3 Statistical Models for HCI Lifetime; 3.2.4 Lifetime Sensitivity; 3.3 Negative Bias Temperature Instability; 3.3.1 Degradation Models; 3.3.2 Lifetime Models; 3.4 Electromigration; 3.4.1 Lifetime Prediction; 3.4.2 Lifetime Distribution Model; 3.4.3 Lifetime Sensitivity; 3.5 Soft Errors Due to Memory Alpha Particles; 4 New M-HTOL Approach. | |
505 | 8 | _a4.1 Problematic Zero Failure Criteria4.2 Single Versus Multiple Competing Mechanisms; 4.3 AF Calculation; 4.3.1 TDDB, EM, and HCI Failure Rate Calculations under Single Failure Mechanism Assumption; 4.3.2 TDDB, EM, and HCI Failure Rate Calculations under Multiple Failure Mechanism Assumption; 4.4 Electronic System CFR Approximation/Justification; 4.4.1 Exponential Distribution; 4.4.2 The Reliability of Complex Systems; 4.4.3 Drenick's Theorem; 4.5 PoF-Based Circuits Reliability Prediction Methodology; 4.5.1 Methodology; 4.5.2 Assumptions; 4.5.3 Input Data; 4.5.4 Device Thermal Analysis. | |
505 | 8 | _a4.6 Cell Reliability Estimation4.6.1 ESF Evaluation; 4.6.2 Cell Reliability; 4.7 Chip Reliability Prediction; 4.7.1 Functional Block Reliability; 4.7.2 Power Network EM Estimation; 4.8 Matrix Method; Bibliography. | |
520 | _aThis work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions. | ||
650 | 0 | _aReliability (Engineering) | |
650 | 4 | _aConstraint programming (Computer science) | |
650 | 4 | _aDatabase management. | |
650 | 4 | _aLogic programming. | |
650 | 7 |
_aReliability (Engineering) _2fast _0(OCoLC)fst01093646 |
|
655 | 4 | _aElectronic books. | |
776 | 0 | 8 |
_iPrint version: _aBernstein, Joseph. _tReliability Prediction from Burn-In Data Fit to Reliability Models. _dBurlington : Elsevier Science, 2014 _z9780128007471 |
856 | 4 | 0 |
_zLibro electrónico _3ScienceDirect _uhttp://148.231.10.114:2048/login?url=http://www.sciencedirect.com/science/book/9780128007471 |
596 | _a19 | ||
942 | _cLIBRO_ELEC | ||
999 |
_c206959 _d206959 |