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|---|---|---|---|
| 001 | u380453 | ||
| 003 | SIRSI | ||
| 005 | 20160812084649.0 | ||
| 006 | m o d | ||
| 007 | cr |n||||||||| | ||
| 008 | 130109s2012 vtu o 000 0 eng d | ||
| 040 |
_aEBLCP _beng _epn _cEBLCP _dOCLCO _dOCLCQ _dNT _dOPELS _dOCLCQ _dYDXCP _dIDEBK _dOCLCQ _dUKDOC _dOCLCQ |
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| 020 | _a9781455730599 (electronic bk.) | ||
| 020 | _a1455730599 (electronic bk.) | ||
| 020 | _a9781455730582 (electronic bk.) | ||
| 020 | _a1455730580 (electronic bk.) | ||
| 029 | 1 |
_aAU@ _b000050608479 |
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| 029 | 1 |
_aDEBSZ _b405346417 |
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| 029 | 1 |
_aNZ1 _b15190919 |
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| 050 | 4 | _aQC173.4.P65 .Q384 2012 | |
| 082 | 0 | 4 | _a620.5 |
| 049 | _aTEFA | ||
| 100 | 1 | _aKlapetek, Petr. | |
| 245 | 1 | 0 |
_aQuantitative Data Processing in Scanning Probe Microscopy _h[recurso electrónico] : _bSPM Applications for Nanometrology. |
| 260 |
_aBurlington : _bElsevier Science, _c2012. |
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| 300 | _a1 online resource (335 pages). | ||
| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
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| 338 |
_aonline resource _bcr _2rdacarrier |
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| 490 | 1 | _aMicro and Nano Technologies | |
| 505 | 0 | _aMotivation -- Instrumentation Principles -- Data Models -- Basic Data Processing* -- Dimensional Measurements* -- Force and Mechanical Properties -- Friction and Lateral Forces -- Electrostatic Fields* -- Magnetic Fields -- Local Current Measurements* -- Thermal Measurements -- Optical Measurements -- Sample Data Files -- Numerical Modeling Techniques. | |
| 520 | _aAccurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected. In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website. | ||
| 588 | 0 | _aPrint version record. | |
| 650 | 0 |
_aScanning probe microscopy _xData processing. |
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| 650 | 0 |
_aQualitative research _xData processing. |
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| 650 | 0 | _aScanning probe microscopy. | |
| 650 | 7 |
_aSCIENCE _xNanoscience. _2bisacsh |
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| 650 | 7 |
_aTECHNOLOGY & ENGINEERING _xNanotechnology & MEMS. _2bisacsh |
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| 655 | 4 | _aElectronic books. | |
| 776 | 0 | 8 |
_iPrint version: _aKlapetek, Petr. _tQuantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology. _dBurlington : Elsevier Science, 2012 _z9781455730582 |
| 830 | 0 | _aMicro & nano technologies. | |
| 856 | 4 | 0 |
_zLibro electrónico _3ScienceDirect _uhttp://148.231.10.114:2048/login?url=http://www.sciencedirect.com/science/book/9781455730582 |
| 596 | _a19 | ||
| 942 | _cLIBRO_ELEC | ||
| 999 |
_c207374 _d207374 |
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